4D TECHNOLOGY CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1287

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9857169 Single-step interferometric radius-of-curvature measurements utilizing short-coherence sourcesDec 20, 16Jan 02, 18[G01B]
9746316 High-resolution in-line metrology for roll-to-roll processing operationsFeb 21, 16Aug 29, 17[G01B]
8351048 Linear-carrier phase-mask interferometerAug 16, 10Jan 08, 13[G01B]
8345258 Synchronous frequency-shift mechanism in fizeau interferometerFeb 06, 10Jan 01, 13[G01B]
7777895 Linear-carrier phase-mask interferometerMay 08, 07Aug 17, 10[G01B]
7675628 Synchronous frequency-shift mechanism in Fizeau interferometerSep 07, 07Mar 09, 10[G01B]
7580135 Chromatic compensation in Fizeau interferometerJun 22, 07Aug 25, 09[G01B]
7230717 Pixelated phase-mask interferometerMay 04, 04Jun 12, 07[G01B]
7230718 Simultaneous phase-shifting fizeau interferometerMay 09, 06Jun 12, 07[G01B]
7079251 Calibration and error correction in multi-channel imagingOct 16, 03Jul 18, 06[G01B]

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