ADVANCED INQUIRY SYSTEMS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 4358
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3156

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8889526 Apparatus for thinning, testing and singulating a semiconductor waferJun 10, 13Nov 18, 14[H01L, G01R]
8697456 Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonJul 01, 13Apr 15, 14[H01L]
8476630 Methods of adding pads and one or more interconnect layers to the passivated topside of a wafer including connections to at least a portion of the integrated circuit pads thereonDec 08, 11Jul 02, 13[H01L]
8461024 Methods and apparatus for thinning, testing and singulating a semiconductor waferNov 08, 11Jun 11, 13[H01L]
7960986 Methods and apparatus for multi-modal wafer testingNov 21, 08Jun 14, 11[G01R]
6836130 Method and apparatus for wafer scale testingAug 01, 03Dec 28, 04[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2012/0067,940 ELECTRICAL CONTACT STRUCTURES SUITABLE FOR USE ON WAFER TRANSLATORS AND METHODS OF MAKING SAMEAbandonedMay 12, 11Mar 22, 12[B23K]
2010/0066,395 Wafer Prober Integrated With Full-Wafer ContacterAbandonedMar 13, 09Mar 18, 10[G01R]
2009/0224,410 Wafer translator having a silicon core fabricated with printed circuit board manufacturing techniquesAbandonedMar 07, 08Sep 10, 09[H01L]
2008/0003,819 Laser isolation of metal over alumina underlayer and structures formed therebyAbandonedJun 11, 07Jan 03, 08[H01L]
2007/0229,105 Desktop wafer analysis stationAbandonedMar 27, 07Oct 04, 07[G01R]

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