ADVANTEST CORPORATION

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Details

Technologies

Intl Class Technology # of Patents Rank
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 460 5
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 140 172
 
 
G11C STATIC STORES 57 80
 
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 51 51
 
 
H04B TRANSMISSION 44 120
 
 
H03K PULSE TECHNIQUE 43 64
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 35 77
 
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 34 134
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 32 225
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 32 83
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Top Patents (by citation)

Patent # Title Filing Date Issue Date Intl Class Cited #
5,172,049 IC test equipment Oct 15, 91 Dec 15, 92 [G01R] 126
6,678,645 Method and apparatus for SoC design validation Oct 28, 99 Jan 13, 04 [G06F] 101
5,440,260 Variable delay circuit Jun 02, 94 Aug 08, 95 [H03K] 99
5,313,156 Apparatus for automatic handling Dec 04, 91 May 17, 94 [G01R, B07C] 97
5,290,134 Pick and place for automatic test handler Dec 03, 91 Mar 01, 94 [B65G] 65
5,227,717 Contact assembly for automatic test handler Dec 03, 91 Jul 13, 93 [G01R] 64
5,208,529 Electric device contact assembly Jul 03, 91 May 04, 93 [G01R] 62
5,977,785 Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment May 28, 96 Nov 02, 99 [G01R, F28F, F25B] 56
6,052,284 Printed circuit board with electronic devices mounted thereon Jul 29, 97 Apr 18, 00 [H05K] 55
6,795,496 Jitter measuring device and method Oct 05, 00 Sep 21, 04 [H04Q, H04B] 52
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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2013/0105,691 PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD Oct 15, 12 May 02, 13 [H01J]
2013/0106,450 DRIVE CIRCUIT AND TEST APPARATUS Jul 31, 12 May 02, 13 [G01R, G05F]
2013/0093,453 CONNECTING DEVICE, SEMICONDUCTOR WAFER TEST APPARATUS COMPRISING SAME, AND CONNECTING METHOD Aug 17, 10 Apr 18, 13 [G01R, H01R]
2013/0082,259 TEST CARRIER Oct 03, 12 Apr 04, 13 [H01L]
2013/0082,727 WAFER TRAY, SEMICONDUCTOR WAFER TEST APPARATUS, AND TEST METHOD OF SEMICONDUCTOR WAFER Aug 31, 10 Apr 04, 13 [G01R, H01L]
2013/0086,423 TEST APPARATUS AND TEST METHOD Jul 04, 12 Apr 04, 13 [G06F]
2013/0075,597 ELECTROMAGNETIC WAVE DETECTION DEVICE Sep 13, 12 Mar 28, 13 [G01J]
2013/0075,612 CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM OF THE SAME Nov 16, 12 Mar 28, 13 [G01N]
2013/0068,947 Pattern inspection apparatus and pattern inspection method Oct 31, 11 Mar 21, 13 [H01J]
2013/0068,971 ELECTROMAGNETIC WAVE EMISSION DEVICE Sep 11, 12 Mar 21, 13 [F21V]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8,436,604 Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device Aug 10, 10 May 07, 13 [G01R]
8,431,895 Pattern measuring apparatus and pattern measuring method Sep 09, 10 Apr 30, 13 [H01J, G01N]
8,433,964 Test apparatus and test method Jan 27, 11 Apr 30, 13 [G01R]
8,433,990 Semiconductor test apparatus and test method May 12, 08 Apr 30, 13 [G06F]
8,427,182 Test apparatus and power supply apparatus Aug 23, 10 Apr 23, 13 [G01R]
8,427,187 Probe wafer, probe device, and testing system Aug 16, 10 Apr 23, 13 [G01R]
8,427,188 Test apparatus Jul 16, 10 Apr 23, 13 [G01R]
8,422,762 Abnormality detecting apparatus for detecting abnormality at interface portion of contact arm Oct 31, 07 Apr 16, 13 [G06K]
8,423,840 Pattern generator May 21, 08 Apr 16, 13 [G11C]
8,418,011 Test module and test method Feb 25, 11 Apr 09, 13 [G01R, G06F]

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Top Inventors for This Owner

Inventor Name Address Patent #
Okayasu Toshiyuki
Tokyo, JP
172
Yamaguchi Takahiro
Tokyo, JP
127
Ishida Masahiro
Tokyo, JP
125
Watanabe Daisuke
Tokyo, JP
73
Suda Masakatsu
Tokyo, JP
67
Kojima Shoji
Tokyo, JP
60
Ichiyama Kiyotaka
Tokyo, JP
56
Furukawa Yasuo
Tokyo, JP
49
Soma Mani
Seattle, US
44
Yamaguchi Takahiro
Tokyo, JP
44
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