Amber Engineering, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 474
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
RE40249 Infrared imaging system employing on-focal plane nonuniformity correctionSep 21, 00Apr 22, 08[G01J]
5811808 Infrared imaging system employing on-focal plane nonuniformity correctionSep 12, 96Sep 22, 98[G01J]
5308980 Thermal mismatch accommodated infrared detector hybrid arrayAug 11, 92May 03, 94[H01L, G01J]
5264699 Infrared detector hybrid array with improved thermal cycle reliability and method for making sameFeb 20, 91Nov 23, 93[H01L, G01J]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5846319 Method and apparatus for formation of HgCdTe infrared detection layers employing isothermal crystal growthExpiredMar 13, 96Dec 08, 98[C30B]
5253308 Massively parallel digital image data processor using pixel-mapped input/output and relative indexed addressingExpiredJun 21, 89Oct 12, 93[G06K]
5053700 Method for wafer scale testing of redundant integrated circuit diesExpiredJun 01, 90Oct 01, 91[G06F, G01R]
4956602 Wafer scale testing of redundant integrated circuit diesExpiredFeb 14, 89Sep 11, 90[G06F, G01R]
4898834 Open-tube, benign-environment annealing method for compound semiconductorsExpiredJun 27, 88Feb 06, 90[H01L]

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