AMBIOS TECHNOLOGY, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS396
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 3125
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
RE37404 Detection system for atomic force microscopesFeb 14, 97Oct 09, 01[G01B]
5614712 Method of engaging the scanning probe of a scanning probe microscope with a sample surfaceMar 24, 95Mar 25, 97[H01J]
5466935 Programmable, scanned-probe microscope system and methodJan 20, 95Nov 14, 95[H01J]
5388452 Detection system for atomic force microscopesOct 15, 93Feb 14, 95[H01J, G01B]
5357105 Light modulated detection system for atomic force microscopesNov 09, 93Oct 18, 94[G01N, G01B]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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