BIN1 ATE, LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 7440
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR265
 
  
 
H04L TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION 2283
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
H03F AMPLIFIERS 182

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9189239 System and method for performing deterministic processingMay 06, 14Nov 17, 15[G06F]
9032384 System and method for performing processing in a testing systemJul 10, 07May 12, 15[G06F, G01R]
8570921 Apparatus for and method of generating a time referenceMar 11, 10Oct 29, 13[H04L]
8442795 System and method for performing processing in a testing systemJul 10, 07May 14, 13[G06F]
8423315 Digital waveform generation and measurement in automated test equipmentMar 03, 10Apr 16, 13[G06F]
8074059 System and method for performing deterministic processingSep 02, 05Dec 06, 11[G06F]
8065663 System and method for performing processing in a testing systemJul 10, 07Nov 22, 11[G06F]
7869986 System and method for performing processing in a testing systemJul 10, 07Jan 11, 11[H04L, G06F]
7844412 System and method for performing processing in a testing systemJul 10, 07Nov 30, 10[G01M, H03F]
7769558 Digital waveform generation and measurement in automated test equipmentJul 10, 07Aug 03, 10[G01M, G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2016/0003,892 SYSTEM AND METHOD FOR PERFORMING PROCESSING IN A TESTING SYSTEMAbandonedMay 11, 15Jan 07, 16[G01R]

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