BRUKER-FRANZEN ANALYTIK GMBH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 4386
 
  
 
B01D SEPARATION 14120
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 6200
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 258
 
  
 
B60B VEHICLE WHEELS 131
 
  
 
C07H SUGARS; DERIVATIVES THEREOF; NUCLEOSIDES; NUCLEOTIDES; NUCLEIC ACIDS 198
 
  
 
C12M APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY 148
 
  
 
C12P FERMENTATION OR ENZYME-USING PROCESSES TO SYNTHESISE A DESIRED CHEMICAL COMPOUND OR COMPOSITION OR TO SEPARATE OPTICAL ISOMERS FROM A RACEMIC MIXTURE 198
 
  
 
C12Q MEASURING OR TESTING PROCESSES INVOLVING ENZYMES OR MICRO-ORGANISMS 1124

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6303298 Two-step method of DNA amplification for MALDI-TOF measurementMar 06, 98Oct 16, 01[C07H, C12Q, G01N]
6180372 Method and devices for extremely fast DNA replication by polymerase chain reactions (PCR)Mar 27, 98Jan 30, 01[C12P, C12M, G01N]
6133568 Ion trap mass spectrometer of high mass-constancyJul 28, 98Oct 17, 00[H01J, B01D]
6051831 High-mass detector with high mass-resolution for time-of-flight mass spectrometersOct 14, 97Apr 18, 00[H01J, G01D]
6049077 Time-of-flight mass spectrometer with constant flight path lengthAug 13, 98Apr 11, 00[H01J]
5969348 Wide mass range focusing in time-of-flight mass spectrometersSep 19, 97Oct 19, 99[H21J, B01D]
5936241 Method for space-charge control of daughter ions in ion trapsFeb 27, 98Aug 10, 99[H01J]
5910656 Adjustment of the sample support in time-of-flight mass spectrometersAug 14, 97Jun 08, 99[H01J]
5905259 Linear time-of-flight mass spectrometer with high mass resolutionAug 28, 97May 18, 99[H01J]
5903003 Methods of comparative analysis using ion trap mass spectrometersFeb 27, 98May 11, 99[H01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5898173 High resolution ion detection for linear time-of-flight mass spectrometersExpiredAug 29, 97Apr 27, 99[H01J]
5898174 Geometry for a linear time-of-light mass spectrometer with very high resolutionExpiredSep 09, 97Apr 27, 99[H01J]
5858043 Virtual impactors with slit shaped nozzles without slit endsExpiredNov 25, 97Jan 12, 99[B01D]
5859433 Ion trap mass spectrometer with vacuum-external ion generationExpiredJun 28, 96Jan 12, 99[H01J, G01D]
5505832 Device and method for mass spectrometric analysis of substance mixtures by coupling capillary electrophoretic separation (CE) with electrospray ionization (ESI)ExpiredMay 02, 95Apr 09, 96[H01J, G01N]
5404765 Inlet valve for a high-vacuum analyzer with bypass evacuationExpiredJan 27, 93Apr 11, 95[F16K, G01N]
5347127 Method and device for in-phase excitation of ion ejection from ion trap mass spectrometersExpiredDec 23, 92Sep 13, 94[H01J, B01D]
5331157 Method of clean removal of ionsExpiredNov 25, 92Jul 19, 94[H01J, B01D]
5294797 Method and apparatus for generating ions from thermally unstable, non-volatile, large molecules, particularly for a mass spectrometer such as a time-of-flight mass spectrometerExpiredMar 12, 92Mar 15, 94[H01J]
5216925 Apparatus for non-intrusive continuous and automatic taking of samples, storing and supplying of samples and data for a possible evaluationExpiredNov 26, 90Jun 08, 93[G01N]
5205178 Method for non-intrusive continuous and automatic taking of samples, storing and supplying of samples and data for a possible evaluationExpiredJun 04, 92Apr 27, 93[G01N]
5062935 Method of vaporizing a sample substanceExpiredMar 21, 89Nov 05, 91[B23K, G01N]
5032722 MS-MS time-of-flight mass spectrometerExpiredJun 20, 90Jul 16, 91[H01J, E01D]
5028777 Method for mass-spectroscopic examination of a gas mixture and mass spectrometer intended for carrying out this methodExpiredDec 16, 88Jul 02, 91[H01J]
4982616 Sampling device for inspection vehiclesExpiredOct 13, 89Jan 08, 91[G01N]
4541268 Method and device for the sampling of trace elements in gases, liquids, solids or in surface layersExpiredMay 20, 83Sep 17, 85[G01N]
4433982 Input head of a measuring or identification system for chemical agentsExpiredNov 05, 81Feb 28, 84[B01D]
4230943 Mass spectrometerExpiredNov 07, 78Oct 28, 80[H01J, B01D]
4220545 Ionization chamber for chemical ionizationExpiredAug 21, 78Sep 02, 80[H01J]
4213557 Method for producing a mass filter analyzer system and analyzer system produced according to the methodExpiredAug 21, 78Jul 22, 80[C03B, B23K]

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