BUCKLEY, DELMAS R., JR.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8156395 Methods for generating test patterns for sequential circuitsJul 27, 09Apr 10, 12[G06F, G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7958421 Single-pass, concurrent-validation methods for generating test patterns for sequential circuitsExpiredAug 16, 07Jun 07, 11[G06F, G01R]
7231571 Single-pass methods for generating test patterns for sequential circuitsExpiredApr 28, 05Jun 12, 07[G01R]
7165231 Method and system for incremental behavioral validation of digital design expressed in hardware description languageExpiredNov 09, 04Jan 16, 07[G06F]
6789222 Single-pass methods for generating test patterns for combinational circuitsExpiredJan 05, 01Sep 07, 04[H01L, G01R]
2003/0135,832 Method for creating a design verification test benchAbandonedDec 02, 02Jul 17, 03[G06F]
6490711 Method for creating a design verification test benchExpiredDec 18, 00Dec 03, 02[G06F]

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