CARL ZEISS MICROSCOPY GMBH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 34538
 
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 11643
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 96111
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 53145
 
 
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 4239
 
 
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 39203
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS2178
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 18117
 
 
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 1531
 
 
 
1606 OPTICAL ARTICLES825

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0039,058 Light microscope and method for recording images with a light microscopeOct 20, 17Feb 08, 18[G02B]
2018/0018,758 METHOD AND DEVICE FOR DETERMINING THE POSITION OF AN OPTICAL BOUNDARY SURFACE ALONG A FIRST DIRECTIONJul 14, 17Jan 18, 18[G02B, G06T]
2017/0329,129 METHOD FOR GENERATING A CONTROL FUNCTION AND METHOD FOR OPERATING A SCANNING UNITMay 12, 17Nov 16, 17[G05B, G02B]
2017/0299,853 Microscope and Method for SPIM MicroscopyJun 30, 17Oct 19, 17[G02B]
2017/0301,101 DEVICE AND METHOD FOR PRODUCING A THREE-DIMENSIONAL IMAGE OF AN OBJECTSep 08, 15Oct 19, 17[G06T]
2017/0293,126 Microscope and Component for Multi-beam ScanningMar 12, 15Oct 12, 17[G02B]
2017/0227,749 HIGH-RESOLUTION SCANNING MICROSCOPY WITH DISCRIMINATION BETWEEN AT LEAST TWO WAVELENGTH RANGESAug 05, 15Aug 10, 17[G02B]
2017/0205,617 Method and Device for Imaging an ObjectJul 20, 15Jul 20, 17[G02B]
2017/0167,856 Determining the Position of an Object in the Beam Path of an Optical DeviceJul 10, 15Jun 15, 17[G02B, G01B]
2017/0131,534 MicroscopeJan 25, 17May 11, 17[G02B, G01N]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9916964 Method of operating a charged particle microscope and charged particle microscope operating according to such methodAug 24, 16Mar 13, 18[H01J, G01N]
9905394 Method for analyzing an object and a charged particle beam device for carrying out this methodFeb 16, 17Feb 27, 18[H01J]
9905395 Method for structuring an object with the aid of a particle beam apparatusSep 28, 15Feb 27, 18[B44C, C23C, H01J]
9891423 Method for the correction of spherical aberration in microscopic applicationsFeb 09, 15Feb 13, 18[H04N, G02B]
9885860 Microscope and method for high-resolution 3D fluorescence microscopyDec 13, 12Feb 06, 18[G02B, G01N]
9864182 High-resolution scanning microscopySep 18, 14Jan 09, 18[G02B]
9857318 Method for generating image data relating to an object and particle beam device for carrying out this methodMar 18, 14Jan 02, 18[G02B, G01N]
9857578 Laser scanning microscopeNov 05, 15Jan 02, 18[G02B]
9857579 System for microscopic applicationsApr 09, 15Jan 02, 18[H04N, G02B]
9857581 Luminescence microscopyMay 27, 14Jan 02, 18[H04N, G02B, G06T, G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0038,321 ANALYZING AN OBJECT USING A PARTICLE BEAM APPARATUSAbandonedOct 20, 16Feb 09, 17[G01N]
9275832 Particle beam device and method for processing and/or analyzing a sampleWithdrawnJan 06, 12Mar 01, 16[H01J]
2016/0020,064 Apparatus for focusing and for storage of ions and for separation of pressure areasAbandonedJul 20, 15Jan 21, 16[H01J]
2015/0370,057 Method for operating a light microscope and optical assemblyAbandonedFeb 05, 14Dec 24, 15[G02B]
2015/0355,446 METHOD FOR THE MICROSCOPE IMAGING OF SAMPLES ADHERING TO BOTTOMS OF FLUID FILLED WELLS OF A MICROTITER PLATEAbandonedJun 05, 15Dec 10, 15[G02B]
2015/0253,556 Confocal Incident-Light Scanning Microsope For Multipoint ScanningAbandonedSep 27, 13Sep 10, 15[G02B, H01J]
2015/0241,682 IMMERSION MEDIUM AND ITS LAYOUT IN AN OPTICAL SYSTEMAbandonedFeb 27, 15Aug 27, 15[G02B, C08G, C08F, C07C, C08K, C08L]
2015/0235,829 METHOD FOR MASS SPECTROMETRIC EXAMINATION OF GAS MIXTURES AND MASS SPECTROMETER THEREFORAbandonedMar 16, 15Aug 20, 15[H01J]
2015/0144,801 PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING THE SAMEAbandonedDec 08, 14May 28, 15[H01J]
2014/0353,451 PIVOT ARM STAND FOR DIGITAL MICROSCOPESAbandonedApr 09, 14Dec 04, 14[F16M, G02B, F16C]
2014/0339,439 Method for High-Resolution 3D Localization MicroscopyAbandonedMay 13, 14Nov 20, 14[G01N]
2014/0326,874 PRINTED CIRCUIT BOARD MULTIPOLE UNITS USED FOR ION TRANSPORTATIONAbandonedMay 16, 14Nov 06, 14[H01J]
2014/0327,961 Slider for Introduction into an Optical Path of a Light MicroscopeAbandonedNov 29, 11Nov 06, 14[G02B]
2014/0313,577 METHOD FOR ILLUMINATING AN OBJECT IN A DIGITAL LIGHT MICROSCOPE, DIGITAL LIGHT MICROSCOPE AND BRIGHT FIELD REFLECTED-LIGHT ILLUMINATION DEVICE FOR A DIGITAL LIGHT MICROSCOPEAbandonedApr 17, 14Oct 23, 14[G02B]
2014/0299,577 APPARATUS AND METHOD FOR SURFACE PROCESSING OF A SUBSTRATEAbandonedJun 23, 14Oct 09, 14[C23C, H01J]
2014/0293,410 LASER SCANNING MICROSCOPEAbandonedOct 31, 13Oct 02, 14[G02B]
2014/0233,029 SPECTROMETERAbandonedJul 23, 12Aug 21, 14[G01J]
2014/0192,406 LASER SCANNING MICROSCOPE HAVING AN ILLUMINATION ARRAYAbandonedJul 31, 12Jul 10, 14[G02B]
2014/0168,763 VARIABLE IMAGING SYSTEM WITH AN OBJECTIVE OF FIXED FOCAL LENGTHAbandonedDec 13, 13Jun 19, 14[G02B]
2014/0118,528 SETTING UNIT AND METHOD FOR SETTING A SEQUENCE FOR THE AUTOMATIC RECORDING OF IMAGES OF AN OBJECT BY MEANS OF A RECORDING DEVICE, AND RECORDING DEVICE HAVING SUCH A SETTING UNITAbandonedOct 28, 13May 01, 14[G02B]

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