CASCADE MICROTECH, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 12851
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 9120
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3186
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 3186
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3336
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2145
 
 
 
B23B TURNING; BORING 145
 
 
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 135
 
 
 
B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING145
 
 
 
B25J MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES 148

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0103,153 PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAMEDec 17, 15Apr 14, 16[G01R]
2015/0301,082 RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOSERS, AND METHODS FOR USING AND FORMING THE SAMEJun 30, 15Oct 22, 15[G01R]
2015/0255,322 WAFER-HANDLING END EFFECTORSFeb 25, 15Sep 10, 15[H01L, B25J]
2015/0241,472 SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICESFeb 18, 15Aug 27, 15[G01R]
2015/0008,948 PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATESep 19, 14Jan 08, 15[G01R]
2014/0239,991 METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THERMAL CONDITIONSApr 02, 14Aug 28, 14[G01R]
2014/0125,363 SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERSNov 04, 13May 08, 14[G01R]
2013/0183,898 SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICESSep 16, 11Jul 18, 13[H04B]
2013/0075,982 HIGH VOLTAGE CHUCK FOR A PROBE STATIONApr 11, 11Mar 28, 13[G01R, H01L]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9,435,858 Focusing optical systems and methods for testing semiconductorsMar 14, 11Sep 06, 16[G01R, G01B]
9,429,638 Method of replacing an existing contact of a wafer probing assemblyApr 01, 13Aug 30, 16[G01R, H01R, B32B]
9,395,411 Method for testing a test substrate under defined thermal conditions and thermally conditionable proberJul 29, 13Jul 19, 16[G01R]
9,377,423 Systems and methods for handling substrates at below dew point temperaturesDec 27, 13Jun 28, 16[G01R, G01N]
9,372,214 High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the sameMay 31, 12Jun 21, 16[G01R, H01P]
9,373,533 Systems and methods for providing wafer access in a wafer processing systemDec 27, 13Jun 21, 16[G01R, H01L]
9,244,099 Probe head assemblies, components thereof, test systems including the same, and methods of operating the sameMay 03, 12Jan 26, 16[G01R]
9,245,317 Optically enhanced digital imaging systemAug 22, 12Jan 26, 16[H04N, G02B, G06T]
9,194,885 Modular prober and method for operating sameSep 02, 11Nov 24, 15[G01R]
9,110,131 Method and device for contacting a row of contact areas with probe tipsApr 13, 10Aug 18, 15[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0184,003 SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TESTABANDec 27, 13Jul 03, 14[G01R, H02K]
2013/0321,018 MEMBRANE PROBING METHOD USING IMPROVED CONTACTABANMay 23, 13Dec 05, 13[G01R]
2013/0069,680 RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROFABANSep 11, 12Mar 21, 13[G01R, H05K]
2013/0015,871 SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICESABANJul 05, 12Jan 17, 13[G01R]
8,069,491 Probe testing structureExpiredJun 20, 07Nov 29, 11[G01Q]
2011/0181,710 ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBERABANJul 30, 10Jul 28, 11[H04N]
2011/0178,752 LINE-REFLECT-REFLECT MATCH CALIBRATIONABANMar 11, 11Jul 21, 11[G06F]
7,898,273 Probe for testing a device under testExpiredFeb 17, 09Mar 01, 11[G01R]
7,876,114 Differential waveguide probeExpiredAug 07, 08Jan 25, 11[G01R, H01P]
7,876,115 Chuck for holding a device under testExpiredFeb 17, 09Jan 25, 11[G01R]
2010/0264,948 DIFFERENTIAL SIGNAL PROBING SYSTEMABANJun 16, 10Oct 21, 10[G01R]
2010/0251,545 WAFER PROBEABANJun 18, 10Oct 07, 10[H01R]
2010/0253,377 ACTIVE WAFER PROBEABANJun 16, 10Oct 07, 10[G01R]
2010/0244,874 TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALSABANJun 16, 10Sep 30, 10[G01R]
7,768,271 Method for calibration of a vectorial network analyzer having more than two portsExpiredNov 19, 07Aug 03, 10[G01R]
7,769,555 Method for calibration of a vectorial network analyzerExpiredNov 19, 07Aug 03, 10[G01D]
7,761,983 Method of assembling a wafer probeExpiredOct 18, 07Jul 27, 10[H01R, H05K]
7,764,072 Differential signal probing systemExpiredFeb 22, 07Jul 27, 10[G01R]
7,759,953 Active wafer probeExpiredAug 14, 08Jul 20, 10[G01R]
7,723,999 Calibration structures for differential signal probingExpiredFeb 22, 07May 25, 10[G01R]

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