CASCADE MICROTECH, INC.
Patent Owner
Stats
- 137 US PATENTS IN FORCE
- 2 US APPLICATIONS PENDING
- Feb 01, 2018 most recent publication
Details
- 137 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 8,621 Total Citation Count
- Feb 21, 1979 Earliest Filing
- 188 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2017/0330,677 SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, METHODS OF FABRICATING SPACE TRANSFORMERS, AND METHODS OF PLANARIZING SPACE TRANSFORMERSMay 11, 16Nov 16, 17[H01F]
2017/0248,973 PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROLFeb 29, 16Aug 31, 17[H01L, G05B, G05D, G01R]
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9874585 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameJun 30, 15Jan 23, 18[H01L, G01R]
9804196 Probes with fiducial marks, probe systems including the same, and associated methodsJan 15, 16Oct 31, 17[G01R]
9470753 Systems and methods for testing electronic devices that include low power output driversNov 04, 13Oct 18, 16[G01R]
9435858 Focusing optical systems and methods for testing semiconductorsMar 14, 11Sep 06, 16[G01R, G01B]
9429638 Method of replacing an existing contact of a wafer probing assemblyApr 01, 13Aug 30, 16[H01R, G01R, B32B]
9395411 Method for testing a test substrate under defined thermal conditions and thermally conditionable proberJul 29, 13Jul 19, 16[G01R]
9377423 Systems and methods for handling substrates at below dew point temperaturesDec 27, 13Jun 28, 16[G01N, G01R]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2017/0212,166 PROBE HEAD ASSEMBLIES WITH CONSTRAINED INTERNAL MOTION AND PROBE SYSTEMS INCLUDING THE PROBE HEAD ASSEMBLIESAbandonedJan 27, 16Jul 27, 17[G01R]
2014/0184,003 SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TESTAbandonedDec 27, 13Jul 03, 14[H02K, G01R]
2013/0183,898 SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICESAbandonedSep 16, 11Jul 18, 13[H04B]
2013/0069,680 RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROFAbandonedSep 11, 12Mar 21, 13[G01R, H05K]
2013/0015,871 SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICESAbandonedJul 05, 12Jan 17, 13[G01R]
2011/0181,710 ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBERAbandonedJul 30, 10Jul 28, 11[H04N]
7768271 Method for calibration of a vectorial network analyzer having more than two portsExpiredNov 19, 07Aug 03, 10[G01R]
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