CASCADE MICROTECH, INC.

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Technologies

Intl Class Technology # of Patents Rank
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 14035
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 9106
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 2136
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2159
 
 
 
H01H ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES 274
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2101
 
 
 
B23B TURNING; BORING 139
 
 
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 126
 
 
 
B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING134
 
 
 
F28F DETAILS OF HEAT-EXCHANGE OR HEAT-TRANSFER APPARATUS, OF GENERAL APPLICATION 135

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2014/0028,337 METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITIONS AND THERMALLY CONDITIONABLE PROBERJul 29, 13Jan 30, 14[G01R]
2013/0321,018 MEMBRANE PROBING METHOD USING IMPROVED CONTACTMay 23, 13Dec 05, 13[G01R]
2013/0220,513 REPLACEABLE COUPON FOR A PROBING APPARATUSApr 01, 13Aug 29, 13[G01R, B32B]
2013/0183,898 SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICESSep 16, 11Jul 18, 13[H04B]
2013/0075,982 HIGH VOLTAGE CHUCK FOR A PROBE STATIONApr 11, 11Mar 28, 13[G01R, H01L]
2013/0069,680 RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROFSep 11, 12Mar 21, 13[G01R, H05K]
2013/0044,203 OPTICALLY ENHANCED DIGITAL IMAGING SYSTEMAug 22, 12Feb 21, 13[H04N]
2013/0027,070 METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE TIPSApr 13, 10Jan 31, 13[G01R]
2013/0015,871 SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICESJul 05, 12Jan 17, 13[G01R]
2013/0010,099 SYSTEM FOR TESTING SEMICONDUCTORSMar 14, 11Jan 10, 13[H04N]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8,680,879 Chuck for supporting and retaining a test substrate and a calibration substrateAug 12, 11Mar 25, 14[G01R]
8,497,693 Method for testing a test substrate under defined thermal conditions and thermally conditionable proberOct 01, 08Jul 30, 13[G01R]
8,451,017 Membrane probing method using improved contactJun 18, 10May 28, 13[G01R, H01R]
8,410,806 Replaceable coupon for a probing apparatusNov 20, 09Apr 02, 13[G01R]
8,402,848 Probe holderOct 10, 08Mar 26, 13[G01N]
8,344,744 Probe station for on-wafer-measurement under EMI-shieldingJun 18, 10Jan 01, 13[G01R]
8,319,503 Test apparatus for measuring a characteristic of a device under testNov 16, 09Nov 27, 12[G01R]
8,278,951 Probe station for testing semiconductor substrates and comprising EMI shieldingNov 15, 07Oct 02, 12[G01R]
8,240,650 Chuck with triaxial constructionMar 14, 08Aug 14, 12[G01R, B23Q, B23B, B25B, F28F]
8,167,648 Low noise connector with cables having a center, middle and outer conductorsFeb 18, 11May 01, 12[H01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Filing Date Issue/Pub Date Intl Class
2011/0181,710 ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBERJul 30, 10Jul 28, 11[H04N]
2011/0178,752 LINE-REFLECT-REFLECT MATCH CALIBRATIONMar 11, 11Jul 21, 11[G06F]
2010/0264,948 DIFFERENTIAL SIGNAL PROBING SYSTEMJun 16, 10Oct 21, 10[G01R]
2010/0251,545 WAFER PROBEJun 18, 10Oct 07, 10[H01R]
2010/0253,377 ACTIVE WAFER PROBEJun 16, 10Oct 07, 10[G01R]
2010/0244,874 TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALSJun 16, 10Sep 30, 10[G01R]
2010/0106,439 PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITSOct 30, 09Apr 29, 10[G01R]
2010/0011,569 APPARATUS AND METHOD FOR ASSEMBLING SEVERAL SEMICONDUCTOR DEVICES ONTO A TARGET SUBSTRATEAug 27, 08Jan 21, 10[B23P]
2010/0001,742 Calibration techniqueJun 10, 09Jan 07, 10[G01R]
2009/0314,051 METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COMPONETS AND METHOD FOR CALIBRATION OF A MEASURING UNITJun 22, 09Dec 24, 09[G01R, G01D]
7,626,379 Probe station having multiple enclosuresOct 24, 07Dec 01, 09[G01R]
7,618,590 Fluid dispensing systemJun 26, 06Nov 17, 09[B01L]
7,609,077 Differential signal probe with integral balunJun 11, 07Oct 27, 09[G01R]
7,595,632 Wafer probe station having environment control enclosureJan 02, 08Sep 29, 09[G01R]
7,589,518 Wafer probe station having a skirting componentFeb 11, 05Sep 15, 09[G01R]
2009/0178,277 Method of constructing a membrane probe using a depressionFeb 18, 09Jul 16, 09[H01K]
7,560,942 Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatusFeb 13, 07Jul 14, 09[G01R]
7,550,984 Probe station with low noise characteristicsOct 04, 07Jun 23, 09[G01R]
7,533,462 Method of constructing a membrane probeDec 01, 06May 19, 09[H01R]
7,518,358 Chuck for holding a device under testOct 23, 07Apr 14, 09[G01R]

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