CASCADE MICROTECH, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 14051
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 9124
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 7355
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 4202
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 3202
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2154
 
 
 
B23B TURNING; BORING 151
 
 
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 139
 
 
 
B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING143
 
 
 
B25J MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES 157

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0330,677 SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, METHODS OF FABRICATING SPACE TRANSFORMERS, AND METHODS OF PLANARIZING SPACE TRANSFORMERSMay 11, 16Nov 16, 17[H01F]
2017/0248,973 PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROLFeb 29, 16Aug 31, 17[H01L, G05B, G05D, G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9874585 Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameJun 30, 15Jan 23, 18[H01L, G01R]
9804196 Probes with fiducial marks, probe systems including the same, and associated methodsJan 15, 16Oct 31, 17[G01R]
9784763 Shielded probe systems with controlled testing environmentsApr 08, 16Oct 10, 17[G01N, G01R]
9741599 High voltage chuck for a probe stationMar 16, 16Aug 22, 17[H01L, G01R]
9506973 High voltage chuck for a probe stationApr 11, 11Nov 29, 16[H01L, G01R]
9470753 Systems and methods for testing electronic devices that include low power output driversNov 04, 13Oct 18, 16[G01R]
9435858 Focusing optical systems and methods for testing semiconductorsMar 14, 11Sep 06, 16[G01R, G01B]
9429638 Method of replacing an existing contact of a wafer probing assemblyApr 01, 13Aug 30, 16[H01R, G01R, B32B]
9395411 Method for testing a test substrate under defined thermal conditions and thermally conditionable proberJul 29, 13Jul 19, 16[G01R]
9377423 Systems and methods for handling substrates at below dew point temperaturesDec 27, 13Jun 28, 16[G01N, G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0212,166 PROBE HEAD ASSEMBLIES WITH CONSTRAINED INTERNAL MOTION AND PROBE SYSTEMS INCLUDING THE PROBE HEAD ASSEMBLIESAbandonedJan 27, 16Jul 27, 17[G01R]
2014/0184,003 SYSTEMS AND METHODS FOR ROTATIONAL ALIGNMENT OF A DEVICE UNDER TESTAbandonedDec 27, 13Jul 03, 14[H02K, G01R]
2013/0321,018 MEMBRANE PROBING METHOD USING IMPROVED CONTACTAbandonedMay 23, 13Dec 05, 13[G01R]
2013/0183,898 SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICESAbandonedSep 16, 11Jul 18, 13[H04B]
2013/0069,680 RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROFAbandonedSep 11, 12Mar 21, 13[G01R, H05K]
2013/0015,871 SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICESAbandonedJul 05, 12Jan 17, 13[G01R]
8069491 Probe testing structureExpiredJun 20, 07Nov 29, 11[G01Q]
2011/0181,710 ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBERAbandonedJul 30, 10Jul 28, 11[H04N]
2011/0178,752 LINE-REFLECT-REFLECT MATCH CALIBRATIONAbandonedMar 11, 11Jul 21, 11[G06F]
7898273 Probe for testing a device under testExpiredFeb 17, 09Mar 01, 11[G01R]
7876114 Differential waveguide probeExpiredAug 07, 08Jan 25, 11[H01P, G01R]
7876115 Chuck for holding a device under testExpiredFeb 17, 09Jan 25, 11[G01R]
2010/0264,948 DIFFERENTIAL SIGNAL PROBING SYSTEMAbandonedJun 16, 10Oct 21, 10[G01R]
2010/0251,545 WAFER PROBEAbandonedJun 18, 10Oct 07, 10[H01R]
2010/0253,377 ACTIVE WAFER PROBEAbandonedJun 16, 10Oct 07, 10[G01R]
2010/0244,874 TEST STRUCTURE AND PROBE FOR DIFFERENTIAL SIGNALSAbandonedJun 16, 10Sep 30, 10[G01R]
7768271 Method for calibration of a vectorial network analyzer having more than two portsExpiredNov 19, 07Aug 03, 10[G01R]
7769555 Method for calibration of a vectorial network analyzerExpiredNov 19, 07Aug 03, 10[G01D]
7761983 Method of assembling a wafer probeExpiredOct 18, 07Jul 27, 10[H01R, H05K]
7764072 Differential signal probing systemExpiredFeb 22, 07Jul 27, 10[G01R]

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