CERPROBE CORPORATION

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6002426 Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuitsExpiredJul 02, 97Dec 14, 99[H04N]
5942908 Apparatus for testing a nonpackaged dieExpiredAug 12, 97Aug 24, 99[G01R]
5635766 Hermetically sealed semiconductor deviceExpiredFeb 21, 96Jun 03, 97[H01L]
5557148 Hermetically sealed semiconductor deviceExpiredDec 20, 94Sep 17, 96[H01L]
5286680 Semiconductor die packages having lead support frameExpiredJul 09, 92Feb 15, 94[H01L]
5285105 Semiconductor die packages having lead support frameExpiredJul 09, 92Feb 08, 94[H01L]
5184207 Semiconductor die packages having lead support frameExpiredOct 31, 90Feb 02, 93[H01L]
5066907 Probe system for device and circuit testingExpiredFeb 06, 90Nov 19, 91[G01R]

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