CHROMA ATE INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 28131
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS495
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 474
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3203
 
  
 
G05D SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES 381
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3444
 
  
 
H01M PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY 3151
 
  
 
F25B REFRIGERATION MACHINES, PLANTS, OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS 266
 
  
 
F28D HEAT-EXCHANGE APPARATUS, NOT PROVIDED FOR IN ANOTHER SUBCLASS, IN WHICH THE HEAT-EXCHANGE MEDIA DO NOT COME INTO DIRECT CONTACT 243
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2196

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0053,593 TRANSFORMER EMBEDDED WITH THERMALLY CONDUCTIVE MEMBERJun 01, 17Feb 22, 18[H01F]
2018/0045,537 CONTACT DETECTION CIRCUIT OF FOUR-TERMINAL MEASUREMENT DEVICEAug 04, 17Feb 15, 18[G01D]
2018/0031,637 BATTERY TESTING DEVICE AND METHOD THEREOFMay 17, 17Feb 01, 18[H01M, G01R]
2017/0370,965 ELECTRICAL PROBE AND JIG FOR THE SAMEMay 30, 17Dec 28, 17[G01N, G01R]
2017/0168,100 PULSE GENERATING APPARATUS AND CALIBRATING METHOD THEREOFDec 08, 16Jun 15, 17[G01R]
2017/0045,552 PROBEJun 28, 16Feb 16, 17[G01R]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9841487 Calibration board for calibrating signal delays of test channels in an automatic test equipment and timing calibration method thereofOct 30, 15Dec 12, 17[G01R]
9841737 Automatic test system and methodDec 07, 15Dec 12, 17[G05B, G01R]
9823295 Battery simulatorApr 06, 16Nov 21, 17[G01R]
9706098 Inspection system and method for obtaining an adjusted light intensity imageDec 03, 15Jul 11, 17[H04N]
9678158 Apparatus for testing a package-on-package semiconductor deviceMar 11, 15Jun 13, 17[G01R]
9658283 Radiator module system for automatic test equipmentMar 26, 15May 23, 17[G01R, H05K]
9647650 Clock generating deviceDec 16, 15May 09, 17[H03K, G06F]
9638740 Test system with rotational test arms for testing semiconductor componentsOct 08, 13May 02, 17[G01R]
9568245 Heating furnaceApr 08, 15Feb 14, 17[F27B, F27D]
9519024 Apparatus for testing package-on-package semiconductor device and method for testing the sameFeb 09, 15Dec 13, 16[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0066,414 AUTOMATIC RETEST METHOD FOR SYSTEM-LEVEL IC TEST EQUIPMENT AND IC TEST EQUIPMENT USING SAMEAbandonedApr 25, 14Mar 05, 15[G01R]
2015/0022,231 Test Apparatus with Sector Conveyance DeviceAbandonedJul 16, 14Jan 22, 15[G01R]
2014/0176,170 TEST TABLE WITH DRY ENVIRONMENTAbandonedDec 16, 13Jun 26, 14[G01R]
2014/0043,310 OPTICAL DETECTION SYSTEMAbandonedAug 07, 13Feb 13, 14[G09G]
2013/0271,640 IMAGE CAPTURING DEVICEAbandonedMar 14, 13Oct 17, 13[H04N]
2013/0250,299 METHODS OF CALIBRATING COLOR MEASUREMENT DEVICESAbandonedMar 20, 12Sep 26, 13[G01J]
8525996 Light emitting component measuring system and the method thereofExpiredSep 26, 11Sep 03, 13[G01N]
2013/0169,789 OPTICAL INSPECTING SYSTEMAbandonedOct 29, 12Jul 04, 13[H04N]
2013/0113,509 Temperature Control System for IC TesterAbandonedMar 12, 12May 09, 13[G01R]
2013/0114,072 SOLAR CELL INSPECTION METHOD AND APPARATUS THEREOFAbandonedNov 03, 11May 09, 13[G01J]
2013/0009,660 ELECTRICAL CONNECTING DEVICEAbandonedJul 06, 12Jan 10, 13[G01R]
2012/0320,369 OPTICAL MEASUREMENT SYSTEM AND THE DEVICE THEREOFAbandonedOct 04, 11Dec 20, 12[G01J, G01N]
2012/0182,549 LIGHT SOURCE WITH UNIFORM CHROMATICITY AND LUMINANCE AND COLOR SENSOR PROVIDED WITH SAMEAbandonedJan 12, 12Jul 19, 12[F21V, G01J]
2012/0101,782 PROCESS AND APPARATUS FOR MEASURING SPECTRAL RESPONSE OF SOLAR CELL, AND PROCESS FOR COMPENSATING DECAY OF LIGHT SOURCEAbandonedMay 22, 11Apr 26, 12[G06F]
2012/0025,838 SUNLIGHT SIMULATORAbandonedOct 15, 10Feb 02, 12[G01R]
2012/0013,348 TEST FIXTURE FOR TESTING SEMICONDUCTOR DIE WITH ITS LOADING MEMBER MAINTAINED FLAT THROUGHOUT THE TESTAbandonedOct 03, 10Jan 19, 12[G01R]
2011/0188,036 MONOCHROMATIC MEASUREMENT SYSTEMAbandonedFeb 01, 11Aug 04, 11[G01J]
2011/0175,575 Battery Charging/Discharging SystemAbandonedSep 20, 10Jul 21, 11[H02J]
2011/0066,417 ELECTRONIC LOAD FOR SIMULATING CHARACTERISTICS OF AN LED AND METHOD FOR OPERATING THE SAMEAbandonedMar 17, 10Mar 17, 11[G06G]
2009/0161,311 Top mount surface airflow heatsink and top mount heatsink component deviceAbandonedNov 01, 07Jun 25, 09[H05K]

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