CHUNG CHENG HOLDINGS, LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 34328
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 265
 
  
 
G11B INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER 2136
 
  
 
B07C POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING 126
 
  
 
B29C SHAPING OR JOINING OF PLASTICS; SHAPING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL; AFTER- TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING 1124
 
  
 
F16K VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING172
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
H01C RESISTORS127
 
  
 
H04R LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS 1106
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6927142 Method for fabricating capacitor in semiconductor deviceNov 10, 03Aug 09, 05[H01L]
6912770 Method for fabricating magnetic field sensorDec 11, 02Jul 05, 05[H04R, G11B]
6913995 Method of forming a barrier metal in a semiconductor deviceJul 14, 03Jul 05, 05[H01L]
6878617 Method of forming copper wire on semiconductor deviceDec 30, 02Apr 12, 05[H01L]
6831007 Method for forming metal line of Al/Cu structureMar 14, 02Dec 14, 04[H01L]
6746911 Semiconductor device with stacked memory and logic substrates and method for fabricating the sameMay 22, 03Jun 08, 04[H01L]
6740572 Method for fabricating CMOS transistor of a semiconductor deviceDec 30, 02May 25, 04[H01L]
6720653 Metal layer in semiconductor device including a planar stuffed layer and an insulating film with a projection and method for fabricating the sameNov 15, 01Apr 13, 04[H01L]
6593184 Semiconductor device with stacked memory and logic substrates and method for fabricating the sameJul 27, 01Jul 15, 03[H01L]
6441497 Semiconductor device fabricated on multiple substrates and method for fabricating the sameOct 16, 01Aug 27, 02[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7056790 DRAM cell having MOS capacitor and method for manufacturing the sameExpiredDec 16, 03Jun 06, 06[H01L]
2006/0054,955 DRAM cell having MOS capacitorAbandonedNov 03, 05Mar 16, 06[H01L]
6991992 Method for forming inductor in semiconductor deviceExpiredJun 28, 04Jan 31, 06[H01L]
6977216 Method for forming metal wire in semiconductor deviceExpiredJun 29, 04Dec 20, 05[H01L]
6969665 Method of forming an isolation film in a semiconductor deviceExpiredJul 03, 03Nov 29, 05[H01L]
2005/0172,256 Mask set for measuring an overlapping error and method of measuring an overlapping error using the sameAbandonedMar 08, 04Aug 04, 05[G06F]
6869871 Method of forming metal line in semiconductor device including forming first and second zirconium filmsExpiredDec 23, 03Mar 22, 05[H01L]
6858490 Method for manufacturing merged DRAM with logic deviceExpiredJun 30, 03Feb 22, 05[H01L]
6855600 Method for manufacturing capacitorExpiredMar 05, 03Feb 15, 05[H01L]
6845443 Method of processing a repeat block efficiently in a processor wherein the repeat count is not decremented in a specific case to prevent error in executionExpiredDec 29, 00Jan 18, 05[G06F]
6833303 Method for forming semiconductor deviceExpiredJul 08, 03Dec 21, 04[H01L]
2004/0253,779 Method for manufacturing a bipolar transistor using a CMOS processAbandonedMar 16, 04Dec 16, 04[H01L]
6818095 Chemical mechanical polishing apparatusExpiredNov 24, 03Nov 16, 04[B24B, B24D]
6815305 Method for fabricating BICMOS semiconductor devicesExpiredDec 13, 02Nov 09, 04[H01L]
6743711 Method for forming dual damascene line structureExpiredFeb 05, 02Jun 01, 04[H01L]
6730528 Mask set for measuring an overlapping error and method of measuring an overlapping error using the sameExpiredDec 22, 97May 04, 04[H01L]
6693040 Method for cleaning the contact area of a metal lineExpiredApr 11, 02Feb 17, 04[H01L]
6686289 Method for minimizing variation in etch rate of semiconductor wafer caused by variation in mask pattern densityExpiredJan 09, 02Feb 03, 04[H01L]
6566717 Integrated circuit with silicided ESD protection transistorsExpiredSep 07, 01May 20, 03[H01L]
6544866 Semiconductor device fabricated on multiple substrateExpiredMay 31, 02Apr 08, 03[H01L]

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