Cambridge Instruments Limited

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
4614872 Charged particle deflectionExpiredMay 01, 84Sep 30, 86[H01J, G21K]
4604523 Scannable-beam microscopes and image stores thereforExpiredJan 12, 84Aug 05, 86[G01N]
4587617 Image inspection system for defect detectionExpiredOct 18, 83May 06, 86[G06F, G06K]
4578765 Image comparison systemsExpiredOct 18, 83Mar 25, 86[G06K]
4514634 Electron beam focussingExpiredMar 01, 83Apr 30, 85[H01J, G21K]
4446817 Apparatus for vapor deposition of a film on a substrateExpiredDec 14, 81May 08, 84[C23C, H01L]
4268483 Improvements in and relating to the growth of crystalline materialExpiredMar 14, 77May 19, 81[C30B]
4265661 Direct synthesis of intermetallic compoundsExpiredSep 21, 79May 05, 81[C01B, C01G]
4264385 Growing of crystalsExpiredOct 15, 75Apr 28, 81[C30B]
4211600 Crystal growthExpiredDec 03, 75Jul 08, 80[B01J]

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