Drexelbrook Controls, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G01S RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES1108
 
  
 
G08B SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS 193
 
  
 
H04R LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS 1106

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6062070 Method and apparatus for the sonic measurement of sludge and clarity conditions during the treatment of waste waterOct 29, 96May 16, 00[G01N, G01S]
5777550 High reliability instrument systemJan 03, 97Jul 07, 98[G08B, H04R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5835454 Transducer shroud for improved transducer operation in the treatment of waste waterExpiredJan 14, 97Nov 10, 98[H04R]
5539670 Coating responsive material condition monitoring systemExpiredMar 10, 94Jul 23, 96[G01F]
5510779 Error compensating instrument system with digital communicationsExpiredJun 04, 93Apr 23, 96[G08C]
5278513 Continuous condition sensing systemExpiredAug 22, 91Jan 11, 94[G01R]
5045797 Continuous condition sensing system determining liquid level by admittance measurementExpiredMar 19, 90Sep 03, 91[G01R]
4950998 Continuous condition sensing systemExpiredJul 21, 88Aug 21, 90[G01R]
4849754 Remotely calibratable instrument systemExpiredFeb 02, 88Jul 18, 89[G01F]
4799174 Multiple set point condition monitoring systemsExpiredOct 23, 87Jan 17, 89[G01F]
4788488 Continuous condition sensing systemExpiredOct 14, 86Nov 29, 88[G01R]
4757252 Probe system for measuring the condition of materialsExpiredOct 25, 85Jul 12, 88[G01N, G01G, G01F]
4723122 Remotely calibratable instrument systemExpiredOct 25, 85Feb 02, 88[G01F]
4568874 RF Admittance apparatus and method for monitoring the contents of a pipeExpiredFeb 17, 83Feb 04, 86[G01R, G01F]
4511948 Two layer probeExpiredJan 20, 84Apr 16, 85[G01F, H01G]
4428026 Two layer probeExpiredNov 20, 81Jan 24, 84[G01F, H01G]
4332167 Method of making an RF admittance measuring probe and product thereofExpiredMar 21, 79Jun 01, 82[B29C, B29D, G01F]
4301681 Method of using capacitor probe with a semiconductive electrodeExpiredSep 06, 79Nov 24, 81[G01F]
4235106 System and method for obtaining compensated level measurementsExpiredDec 08, 78Nov 25, 80[G01F]
4232300 Level measuring system using admittance sensingExpiredNov 24, 78Nov 04, 80[G08C, G01R]
4208909 Admittance sensing probe having multiple sensing elementsExpiredNov 24, 78Jun 24, 80[G01F]

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