DYNAMIC MEASUREMENT AND INSPECTION, LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
5367378 Highlighted panel inspectionJun 01, 93Nov 22, 94[G01B]
5307152 Moire inspection systemSep 29, 92Apr 26, 94[G01B]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6084712 Three dimensional imaging using a refractive optic designExpiredNov 03, 98Jul 04, 00[G02B, G01B]
5933231 Method and system for measuring cavities and probe for use thereinExpiredJul 10, 96Aug 03, 99[G01N]
5835218 Moire interferometry system and method with extended imaging depthExpiredJul 22, 97Nov 10, 98[G01B]
5815272 Filter for laser gaging systemExpiredJan 09, 97Sep 29, 98[G01B]
5069549 Moire contouring cameraExpiredNov 02, 90Dec 03, 91[G01B]
4983043 High accuracy structured light profilerExpiredDec 21, 88Jan 08, 91[G01B]
4880991 Non-contact dimensional gage for turned partsExpiredMay 05, 89Nov 14, 89[G01J]
4875777 Off-axis high accuracy structured light profilerExpiredSep 30, 87Oct 24, 89[G01B]

Top Inventors for This Owner

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