ELECTRO SCIENTIFIC INDUSTRIES, INC.

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Technologies

Intl Class Technology # of Patents/ App Rank in Class
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 1784
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 52252
 
 
 
H01S DEVICES USING STIMULATED EMISSION4452
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 35108
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1771
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 15374
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 12161
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 12157
 
 
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 11104
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 9161

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2014/0288,693 IMAGE RECOGNITION BASE ABLATION PATTERN POSITION RECALLMar 14, 14Sep 25, 14[G05B]
2014/0259,659 PHASED ARRAY STEERING FOR LASER BEAM POSITIONING SYSTEMSMar 14, 14Sep 18, 14[B23K, H05K]
2014/0263,201 LASER SYSTEMS AND METHODS FOR AOD ROUT PROCESSINGMar 14, 14Sep 18, 14[B23K]
2014/0263,212 COORDINATION OF BEAM ANGLE AND WORKPIECE MOVEMENT FOR TAPER CONTROLMar 11, 14Sep 18, 14[B23K]
2014/0263,223 LASER SYSTEMS AND METHODS FOR AOD TOOL SETTLING FOR AOD TRAVEL REDUCTIONMar 14, 14Sep 18, 14[B23K]
2014/0268,134 LASER SAMPLING METHODS FOR REDUCING THERMAL EFFECTSMar 13, 14Sep 18, 14[G01J]
2014/0256,205 SYSTEMS AND METHODS FOR PROVIDING POLARIZATION COMPENSATED MULTI-SPECTRAL LASER REPAIR OF LIQUID CRYSTAL DISPLAY PANELSMar 11, 13Sep 11, 14[H01J]
2014/0231,393 PROGRAM CONTROLLED DICING OF A SUBSTRATE USING A PULSED LASER BEAMSep 17, 13Aug 21, 14[B23K, H01L]
2014/0223,991 IN-CHAMBER FLUID HANDLING SYSTEM AND METHODS HANDLING FLUIDS USING THE SAMEFeb 06, 14Aug 14, 14[G01N]
2014/0224,775 LASER ABLATION CELL AND INJECTOR SYSTEM FOR A COMPOSITIONAL ANALYSIS SYSTEMFeb 14, 14Aug 14, 14[H05H]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8,847,110 Laser processing of conductive linksJan 27, 12Sep 30, 14[B23K, H01L]
8,847,113 Laser processing systems and methods for beam dithering and skivingOct 24, 11Sep 30, 14[G02B, G02F, B23K, G06F, H01L]
8,809,734 Methods and systems for thermal-based laser processing a multi-material deviceJul 03, 12Aug 19, 14[B23K, H01L]
8,800,475 Etching a laser-cut semiconductor before dicing a die attach film (DAF) or other material layerMar 04, 14Aug 12, 14[B05C]
8,761,216 Method and apparatus for reliably laser marking articlesJan 11, 13Jun 24, 14[H01S]
8,733,535 Shallow angle vertical rotary loader for electronic device testingJun 17, 11May 27, 14[B65G, B65B]
8,735,740 Method and apparatus for optically transparent via fillingMar 02, 11May 27, 14[H05K]
8,735,772 Method and apparatus for improved laser scribing of opto-electric devicesFeb 20, 11May 27, 14[B23K, H01L]
8,735,774 Force reaction compensation systemJul 28, 09May 27, 14[B23K]
8,729,404 Method and apparatus for optically transparent via fillingMar 02, 11May 20, 14[H05K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Filing Date Issue/Pub Date Intl Class
2012/0264,238 PROGRAM CONTROLLED DICING OF A SUBSTRATE USING A PULSED LASER BEAMApr 17, 12Oct 18, 12[B23K, H01L]
2012/0208,349 Support for Wafer SingulationFeb 01, 07Aug 16, 12[B23B, H01L]
2012/0187,098 ENERGY EFFICIENT, LASER-BASED METHOD AND SYSTEM FOR PROCESSING TARGET MATERIALMar 12, 12Jul 26, 12[B23K]
2012/0175,652 METHOD AND APPARATUS FOR IMPROVED SINGULATION OF LIGHT EMITTING DEVICESJan 06, 11Jul 12, 12[B23K, H01L]
2012/0160,814 METHODS AND SYSTEMS FOR LINK PROCESSING USING LASER PULSES WITH OPTIMIZED TEMPORAL POWER PROFILES AND POLARIZATIONSDec 28, 10Jun 28, 12[B23K]
2012/0083,049 SYSTEM AND METHOD FOR LASER PROCESSING AT NON-CONSTANT VELOCITIESNov 23, 11Apr 05, 12[B23K, H01L]
2011/0243,163 WEDGE-FACETED NONLINEAR CRYSTAL FOR HARMONIC GENERATIONApr 02, 10Oct 06, 11[H01S, G02F]
2011/0220,595 High Strength, High Density Carrier PlateMay 24, 11Sep 15, 11[F16M]
2011/0210,103 SYSTEMS AND METHODS FOR PROCESSING SEMICONDUCTOR STRUCTURES USING LASER PULSES LATERALLY DISTRIBUTED IN A SCANNING WINDOWMay 10, 11Sep 01, 11[B23K]
2011/0177,674 PROCESSING OF MULTILAYER SEMICONDUCTOR WAFERSMar 16, 09Jul 21, 11[G21G, H01L]
2011/0108,534 METHOD AND SYSTEM FOR HIGH-SPEED, PRECISE MICROMACHINING AN ARRAY OF DEVICESJan 11, 11May 12, 11[B23K]
2011/0029,124 PROGRAM CONTROLLED DICING OF A SUBSTRATE USING A PULSED LASER BEAMAug 13, 10Feb 03, 11[G05B]
2010/0252,540 METHOD AND APPARATUS FOR BRITTLE MATERIALS PROCESSINGApr 02, 10Oct 07, 10[B23K]
2010/0252,959 METHOD FOR IMPROVED BRITTLE MATERIALS PROCESSINGMar 25, 10Oct 07, 10[B44C, B29C]
2010/0243,617 PRINTED CIRCUIT BOARD VIA DRILLING STAGE ASSEMBLYMar 26, 09Sep 30, 10[B23B, B23K]
2010/0193,481 LASER CONSTRUCTED WITH MULTIPLE OUTPUT COUPLERS TO GENERATE MULTIPLE OUTPUT BEAMSNov 29, 05Aug 05, 10[B23K]
2010/0133,651 SEMICONDUCTOR STRUCTURE PROCESSING USING MULTIPLE LATERALLY SPACED LASER BEAM SPOTS WITH JOINT VELOCITY PROFILINGDec 02, 09Jun 03, 10[H01L]
2010/0089,881 SEMICONDUCTOR STRUCTURE PROCESSING USING MULTIPLE LATERALLY SPACED LASER BEAM SPOTS DELIVERING MULTIPLE BLOWSDec 15, 09Apr 15, 10[B23K]
2010/0084,662 SEMICONDUCTOR STRUCTURE PROCESSING USING MULTIPLE LASER BEAM SPOTS OVERLAPPING LENGTHWISE ON A STRUCTUREDec 08, 09Apr 08, 10[B23K, H01L]
2010/0078,416 METHOD OF LASER MICRO-MACHINING STAINLESS STEEL WITH HIGH COSMETIC QUALITYSep 26, 08Apr 01, 10[B23K]

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