ELECTRO SCIENTIFIC INDUSTRIES, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 1774
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 50265
 
 
 
H01S DEVICES USING STIMULATED EMISSION4256
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 30113
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1773
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 15384
 
 
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 12171
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 12163
 
 
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 11103
 
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 9172

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2015/0158,116 METHOD AND APPARATUS FOR INTERNALLY MARKING A SUBSTRATE HAVING A ROUGH SURFACEDec 02, 14Jun 11, 15[B23K]
2015/0050,468 LASER SYSTEMS AND METHODS FOR INTERNALLY MARKING THIN LAYERS, AND ARTICLES PRODUCED THEREBYAug 15, 14Feb 19, 15[B41J]
2015/0001,194 LASER PROCESSING SYSTEMS AND METHODS FOR BEAM DITHERING AND SKIVINGSep 18, 14Jan 01, 15[B23K]
2014/0340,507 METHOD OF MEASURING NARROW RECESSED FEATURES USING MACHINE VISIONMay 14, 14Nov 20, 14[H04N]
2014/0312,013 LASER EMISSION-BASED CONTROL OF BEAM POSITIONERMar 15, 14Oct 23, 14[B23K]
2014/0288,693 IMAGE RECOGNITION BASE ABLATION PATTERN POSITION RECALLMar 14, 14Sep 25, 14[G05B]
2014/0259,659 PHASED ARRAY STEERING FOR LASER BEAM POSITIONING SYSTEMSMar 14, 14Sep 18, 14[B23K, H05K]
2014/0263,201 LASER SYSTEMS AND METHODS FOR AOD ROUT PROCESSINGMar 14, 14Sep 18, 14[B23K]
2014/0263,212 COORDINATION OF BEAM ANGLE AND WORKPIECE MOVEMENT FOR TAPER CONTROLMar 11, 14Sep 18, 14[B23K]
2014/0263,223 LASER SYSTEMS AND METHODS FOR AOD TOOL SETTLING FOR AOD TRAVEL REDUCTIONMar 14, 14Sep 18, 14[B23K]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9,036,247 Systems and methods for providing temperature stability of acousto-optic beam deflectors and acousto-optic modulators during useOct 18, 13May 19, 15[G02F]
9,029,731 Methods and systems for laser processing continuously moving sheet materialDec 03, 07May 12, 15[B23K]
9,023,461 Apparatus for optically laser marking articlesOct 21, 10May 05, 15[B41M, B23K]
8,970,238 Probe module with interleaved serpentine test contacts for electronic device testingJun 17, 11Mar 03, 15[G01R]
8,960,686 Controlled surface roughness in vacuum retentionSep 30, 11Feb 24, 15[B23Q, H01L]
8,901,947 Probe out-of-position sensing for automated test equipmentSep 28, 12Dec 02, 14[G01R]
8,894,868 Substrate containing aperture and methods of forming the sameOct 06, 11Nov 25, 14[B44C, B23K, H01L]
8,878,095 Reducing back-reflection in laser micromachining systemsDec 17, 10Nov 04, 14[H01S, B23K]
8,879,064 Apparatus and method for transporting an aerosolDec 23, 11Nov 04, 14[G01N]
8,866,043 Method and apparatus for laser drilling holes with Gaussian pulsesJul 02, 12Oct 21, 14[B23K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0249,566 Kelvin Sense Probe CalibrationABANMar 23, 12Sep 26, 13[G01R]
2013/0234,149 SIDEWALL TEXTURING OF LIGHT EMITTING DIODE STRUCTURESABANMar 09, 12Sep 12, 13[H01L]
2013/0208,074 METHOD AND APPARATUS FOR RELIABLY LASER MARKING ARTICLESABANFeb 15, 13Aug 15, 13[B41J]
2013/0200,050 LINK PROCESSING WITH HIGH SPEED BEAM DEFLECTIONABANSep 10, 12Aug 08, 13[B23K]
2013/0193,617 SYSTEMS AND METHODS FOR SEPARATING NON-METALLIC MATERIALSABANFeb 01, 12Aug 01, 13[B29B]
2013/0146,418 SORTING APPARATUS AND METHOD OF SORTING COMPONENTSABANDec 09, 11Jun 13, 13[B65G]
2012/0263,559 ELECTRONIC COMPONENT HANDLER HAVING GAP SET DEVICEABANJun 25, 12Oct 18, 12[B65G]
2012/0264,238 PROGRAM CONTROLLED DICING OF A SUBSTRATE USING A PULSED LASER BEAMABANApr 17, 12Oct 18, 12[B23K, H01L]
2012/0249,172 ALIGNMENT SYSTEM FOR ELECTRONIC DEVICE TESTINGABANMar 31, 11Oct 04, 12[G01R]
2012/0249,175 CONVEYOR-MOUNTABLE CARRIER FOR ELECTRONIC DEVICE TESTINGABANMar 31, 11Oct 04, 12[G01R]
2012/0208,349 Support for Wafer SingulationABANFeb 01, 07Aug 16, 12[B23B, H01L]
2012/0187,098 ENERGY EFFICIENT, LASER-BASED METHOD AND SYSTEM FOR PROCESSING TARGET MATERIALABANMar 12, 12Jul 26, 12[B23K]
2012/0175,652 METHOD AND APPARATUS FOR IMPROVED SINGULATION OF LIGHT EMITTING DEVICESABANJan 06, 11Jul 12, 12[B23K, H01L]
2012/0168,412 APPARATUS AND METHOD FOR FORMING AN APERTURE IN A SUBSTRATEABANJan 04, 12Jul 05, 12[B23K]
2012/0160,814 METHODS AND SYSTEMS FOR LINK PROCESSING USING LASER PULSES WITH OPTIMIZED TEMPORAL POWER PROFILES AND POLARIZATIONSABANDec 28, 10Jun 28, 12[B23K]
2012/0083,049 SYSTEM AND METHOD FOR LASER PROCESSING AT NON-CONSTANT VELOCITIESABANNov 23, 11Apr 05, 12[B23K, H01L]
2011/0287,607 METHOD AND APPARATUS FOR IMPROVED WAFER SINGULATIONABANMar 30, 11Nov 24, 11[B23K, H01L]
2011/0241,718 Test Plate for Electronic Component HandlerABANJun 17, 11Oct 06, 11[G01R]
2011/0243,163 WEDGE-FACETED NONLINEAR CRYSTAL FOR HARMONIC GENERATIONABANApr 02, 10Oct 06, 11[H01S, G02F]
2011/0220,595 High Strength, High Density Carrier PlateABANMay 24, 11Sep 15, 11[F16M]

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