ELM TECHNOLOGY CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 5357
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
G11C STATIC STORES 1150

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8933715 Configurable vertical integrationMar 13, 13Jan 13, 15[H01L, G01R, G11C]
8080442 Vertical system integrationJun 21, 08Dec 20, 11[H01L]
7402897 Vertical system integrationAug 08, 03Jul 22, 08[H01L]
6288561 Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatusJun 07, 95Sep 11, 01[G01R]
5453404 Method for making an interconnection structure for integrated circuitsMar 24, 94Sep 26, 95[H01L]
5323035 Interconnection structure for integrated circuits and method for making sameOct 13, 92Jun 21, 94[H01L]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0243,211 DISPLAY DEVICE AND DRIVING METHOD THEREOFAbandonedSep 02, 14Aug 27, 15[G09G]
2008/0284,611 Vertical system integrationAbandonedJun 21, 08Nov 20, 08[G08B]
6891387 System for probing, testing, burn-in, repairing and programming of integrated circuitsExpiredJun 09, 04May 10, 05[G01R]
6838896 Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatusExpiredSep 06, 01Jan 04, 05[G01R]
5725995 Method of repairing defective traces in an integrated circuit structureExpiredJun 07, 95Mar 10, 98[G03F]
5654127 Method of making a tester surface with high density probe pointsExpiredJun 07, 95Aug 05, 97[G03F]
5629137 Method of repairing an integrated circuit structureExpiredJun 07, 95May 13, 97[G03F]
5571741 Membrane dielectric isolation IC fabricationExpiredJun 07, 95Nov 05, 96[H01L]
5512397 Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuitsExpiredNov 02, 93Apr 30, 96[G03F]
5451489 Making and testing an integrated circuit using high density probe pointsExpiredApr 30, 93Sep 19, 95[G03F]
5225771 Making and testing an integrated circuit using high density probe pointsExpiredOct 11, 91Jul 06, 93[G01R]
5103557 Making and testing an integrated circuit using high density probe pointsExpiredFeb 16, 90Apr 14, 92[H05K]
5034685 Test device for testing integrated circuitsExpiredNov 14, 89Jul 23, 91[G01R]
5020219 Method of making a flexible tester surface for testing integrated circuitsExpiredNov 14, 89Jun 04, 91[H05K]
4994735 Flexible tester surface for testing integrated circuitsExpiredNov 14, 89Feb 19, 91[G01R]
4924589 Method of making and testing an integrated circuitExpiredMay 16, 88May 15, 90[H05K]

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