Engineering Synthesis Design, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS594

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8482740 Computer generated reference for measurements of aspheric surfacesJun 30, 10Jul 09, 13[G01B]
8269980 White light scanning interferometer with simultaneous phase-shifting moduleMay 11, 10Sep 18, 12[G01B]
7808654 High resolution three dimensional topography using a flatbed scannerJun 10, 08Oct 05, 10[G01B]
7561279 Scanning simultaneous phase-shifting interferometerJun 28, 07Jul 14, 09[G01B]
6937347 Small-beam lateral-shear interferometerSep 18, 02Aug 30, 05[G01B]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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