Erwin Sick GmbH Optik-Elektronik
Patent Owner
Stats
- 3 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Oct 29, 1996 most recent publication
Details
- 3 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 1,268 Total Citation Count
- Mar 23, 1977 Earliest Filing
- 102 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
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Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
5569900 Method and optical scanning apparatus for the identification of a code consisting of sequential light and dark fieldsExpiredJul 11, 94Oct 29, 96[G06K]
5530539 Apparatus for measuring the transit time of electromagnetic wavesExpiredFeb 10, 94Jun 25, 96[G01C, G01S]
5418409 Comparator circuit for triggering a switching process when a variable measurement signal passes through a switching thresholdExpiredJun 24, 93May 23, 95[H03K]
5416316 Optical sensor arrangement for presence detection with variable pulse repetition frequencyExpiredJan 10, 94May 16, 95[G01V]
5250801 Optical sensor for detecting articles in a monitored region and method for operating the sameExpiredJul 02, 92Oct 05, 93[G01N]
5130532 Light barrier grid with electrically decoupled emitters and detectors which are operatable in synchronismExpiredSep 13, 90Jul 14, 92[G01V]
5095214 Optical hole seeking apparatus having dual spaced laser scannersExpiredNov 16, 88Mar 10, 92[G01N]
5079434 Optical scanning appartaus for seeking faults on moving material websExpiredAug 01, 90Jan 07, 92[G01N]
5013153 Interferometric gas component measuring apparatus for small gas moleculesExpiredJul 20, 89May 07, 91[G01J, G01B]
4938601 Optical web monitoring device with row cameras with directed illuminationExpiredMar 18, 88Jul 03, 90[G01N]
4924086 Optical scanning apparatus for detecting faults on a surfaceExpiredOct 28, 88May 08, 90[G01N]
4904877 Optical scanning apparatus for detecting faults in transparent material wherein the plane of incident light is arranged at the breuster angle to the normal to the surfaceExpiredAug 19, 88Feb 27, 90[G01N]
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