FormFactor, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 19629
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 4680
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 32279
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 17115
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 13374
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 770
 
 
 
B05D PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL 681
 
 
 
H01P WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE 644
 
 
 
C25D PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING 535
 
 
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 254

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2014/0340,103 Automated Attaching And Detaching Of An Interchangeable Probe HeadMay 12, 14Nov 20, 14[G01R]
2014/0327,461 Probe Card Assembly For Testing Electronic DevicesMay 05, 14Nov 06, 14[G01R]
2014/0139,250 Contactor Devices With Carbon Nanotube Probes Embedded In A Flexible Film And Processes Of Making SuchNov 20, 12May 22, 14[G01R]
2014/0118,016 Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide HolesOct 31, 12May 01, 14[G01R]
2014/0043,054 VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAYAug 09, 13Feb 13, 14[G01R]
2014/0044,985 PROBE FABRICATION USING COMBINED LASER AND MICRO-FABRICATION TECHNOLOGIESAug 09, 13Feb 13, 14[G01R, B23K]
2013/0271,175 Wiring Substrate With Filled Vias To Accommodate Custom TerminalsApr 03, 13Oct 17, 13[G01R]
2013/0169,301 Probes With Programmable MotionJan 02, 13Jul 04, 13[G01R]
2013/0135,001 Hybrid Electrical ContactorNov 20, 12May 30, 13[G01R]
2013/0093,450 VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATIONDec 04, 12Apr 18, 13[G01R]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8,896,336 Testing techniques for through-device viasJun 29, 11Nov 25, 14[G01R]
8,872,176 Elastic encapsulated carbon nanotube based electrical contactsOct 05, 11Oct 28, 14[G01R, H01L, B82Y]
8,872,532 Wafer test cassette systemDec 27, 10Oct 28, 14[G01R]
8,872,534 Method and apparatus for testing devices using serially controlled intelligent switchesJul 08, 11Oct 28, 14[G01R]
8,829,937 Fine pitch guided vertical probe array having enclosed probe flexuresJan 27, 11Sep 09, 14[G01R]
8,781,779 Methods and apparatuses for dynamic probe adjustmentNov 09, 12Jul 15, 14[G01C]
8,756,802 Carbon nanotube contact structures for use with semiconductor dies and other electronic devicesDec 31, 12Jun 24, 14[H01R, H01K]
8,760,187 Thermocentric alignment of elements on parts of an apparatusDec 03, 08Jun 24, 14[G01R]
8,736,294 Probe card stiffener with decouplingDec 14, 10May 27, 14[G01R]
8,706,289 Pre-aligner searchMar 23, 12Apr 22, 14[G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Filing Date Issue/Pub Date Intl Class
2011/0171,838 SEGMENTED CONTACTORMar 28, 11Jul 14, 11[H05K]
2011/0115,512 Integrated circuit tester with high bandwidth probe assemblyJul 12, 05May 19, 11[G01R, H03H]
7,868,632 Composite motion probingApr 06, 07Jan 11, 11[G01R]
7,845,072 Method and apparatus for adjusting a multi-substrate probe structureDec 23, 08Dec 07, 10[H05K]
7,836,587 Method of repairing a contactor apparatusSep 19, 07Nov 23, 10[H01R]
7,834,647 Alignment features in a probing deviceJul 14, 09Nov 16, 10[G01R]
2010/0263,432 METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTORApr 23, 10Oct 21, 10[B21D]
2010/0264,949 FLEXURE BAND AND USE THEREOF IN A PROBE CARD ASSEMBLYApr 15, 09Oct 21, 10[G01R]
7,814,453 Process and apparatus for finding paths through a routing spaceOct 23, 03Oct 12, 10[G06F]
2010/0252,317 CARBON NANOTUBE CONTACT STRUCTURES FOR USE WITH SEMICONDUCTOR DIES AND OTHER ELECTRONIC DEVICESApr 03, 09Oct 07, 10[H01R, H05K]
7,798,822 Microelectronic contact structuresJul 28, 09Sep 21, 10[H01R]
7,764,075 High performance probe systemOct 28, 08Jul 27, 10[G01R]
7,746,089 Method and apparatus for indirect planarizationSep 29, 06Jun 29, 10[G01R]
2010/0154,861 PRINTED SOLAR PANELDec 23, 08Jun 24, 10[H01L]
7,737,709 Methods for planarizing a semiconductor contactorAug 28, 07Jun 15, 10[G01R]
2010/0140,793 Process For Manufacturing Contact Elements For Probe Card AssemblesMay 22, 09Jun 10, 10[C23F, H01L]
7,731,503 Carbon nanotube contact structuresAug 21, 06Jun 08, 10[H01R]
7,731,546 Microelectronic contact structureSep 16, 05Jun 08, 10[H01R]
7,732,713 Method to build robust mechanical structures on substrate surfacesAug 07, 07Jun 08, 10[H01R, H05K]
7,729,878 Air bridge structures and methods of making and using air bridge structuresOct 28, 08Jun 01, 10[G06F]

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