FormFactor, Inc.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 17637
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 3391
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 25300
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 15122
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 9399
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 777
 
 
 
B05D PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL 576
 
 
 
C25D PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING 536
 
 
 
H01P WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE 549
 
 
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 253

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2015/0091,596 PROBE RETENTION ARRANGEMENTDec 09, 14Apr 02, 15[G01R]
2015/0015,289 Multipath Electrical Probe And Probe Assemblies With Signal Paths Through Secondary Paths Between Electrically Conductive Guide PlatesJul 09, 14Jan 15, 15[G01R]
2014/0340,103 Automated Attaching And Detaching Of An Interchangeable Probe HeadMay 12, 14Nov 20, 14[G01R]
2014/0327,461 Probe Card Assembly For Testing Electronic DevicesMay 05, 14Nov 06, 14[G01R]
2014/0139,250 Contactor Devices With Carbon Nanotube Probes Embedded In A Flexible Film And Processes Of Making SuchNov 20, 12May 22, 14[G01R]
2014/0118,016 Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide HolesOct 31, 12May 01, 14[G01R]
2014/0043,054 VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAYAug 09, 13Feb 13, 14[G01R]
2014/0044,985 PROBE FABRICATION USING COMBINED LASER AND MICRO-FABRICATION TECHNOLOGIESAug 09, 13Feb 13, 14[G01R, B23K]
2013/0271,175 Wiring Substrate With Filled Vias To Accommodate Custom TerminalsApr 03, 13Oct 17, 13[G01R]
2013/0169,301 Probes With Programmable MotionJan 02, 13Jul 04, 13[G01R]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9,229,029 Hybrid electrical contactorNov 20, 12Jan 05, 16[G01R]
9,121,868 Probes with offset arm and suspension structureJun 19, 12Sep 01, 15[G01R]
9,097,740 Layered probes with coreFeb 09, 10Aug 04, 15[G01R]
9,081,037 Attachment of an electrical element to an electronic device using a conductive materialNov 23, 10Jul 14, 15[G01R]
9,052,342 Probe with cantilevered beam having solid and hollow sectionsSep 30, 11Jun 09, 15[G01R]
9,037,432 Wireless probe card verification system and methodMar 13, 12May 19, 15[G01R]
9,030,222 Sharpened, oriented contact tip structuresAug 06, 10May 12, 15[G01R, H01R]
8,896,336 Testing techniques for through-device viasJun 29, 11Nov 25, 14[G01R]
8,872,176 Elastic encapsulated carbon nanotube based electrical contactsOct 05, 11Oct 28, 14[G01R, H01L, B82Y]
8,872,532 Wafer test cassette systemDec 27, 10Oct 28, 14[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8,067,951 Method of expanding tester drive and measurement capabilityExpiredJul 07, 09Nov 29, 11[G01R]
8,011,089 Method of repairing segmented contactorExpiredAug 25, 09Sep 06, 11[H01R]
8,015,536 Process and apparatus for adjusting tracesExpiredOct 28, 08Sep 06, 11[G06F]
7,999,375 Electronic device with integrated micromechanical contacts and cooling systemExpiredOct 11, 06Aug 16, 11[H01L]
7,994,803 Calibration substrateExpiredSep 29, 09Aug 09, 11[G01R]
2011/0171,838 SEGMENTED CONTACTORABANMar 28, 11Jul 14, 11[H05K]
7,960,990 Closed-grid bus architecture for wafer interconnect structureExpiredApr 20, 10Jun 14, 11[G01R]
2011/0115,512 Integrated circuit tester with high bandwidth probe assemblyABANJul 12, 05May 19, 11[G01R, H03H]
7,897,435 Re-assembly process for MEMS structuresExpiredMay 25, 06Mar 01, 11[H01L]
7,893,700 Configuration of shared tester channels to avoid electrical connections across die area boundary on a waferExpiredJul 28, 08Feb 22, 11[G01R]
7,893,701 Method and apparatus for enhanced probe card architectureExpiredApr 29, 09Feb 22, 11[G01R]
7,884,006 Method to build a wirebond probe card in a many at a time fashionExpiredDec 02, 08Feb 08, 11[H01R, H01L]
7,880,486 Method and apparatus for increasing operating frequency of a system for testing electronic devicesExpiredAug 19, 08Feb 01, 11[G01R]
7,868,632 Composite motion probingExpiredApr 06, 07Jan 11, 11[G01R]
7,863,915 Probe card cooling assembly with direct cooling of active electronic componentsExpiredAug 25, 09Jan 04, 11[G01R]
7,851,794 Rotating contact element and methods of fabricationExpiredDec 28, 06Dec 14, 10[H01L]
7,845,072 Method and apparatus for adjusting a multi-substrate probe structureExpiredDec 23, 08Dec 07, 10[H05K]
7,836,587 Method of repairing a contactor apparatusExpiredSep 19, 07Nov 23, 10[H01R]
7,834,647 Alignment features in a probing deviceExpiredJul 14, 09Nov 16, 10[G01R]
7,825,652 Method and apparatus for remotely buffering test channelsExpiredNov 18, 08Nov 02, 10[G01R]

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