FormFactor, Inc.

Patent Owner

Compare Create Portfolio
2Status Updates

Stats

Details

Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 18634
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 3881
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 27291
 
 
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 15121
 
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 12385
 
 
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 773
 
 
 
H01P WAVEGUIDES; RESONATORS, LINES OR OTHER DEVICES OF THE WAVEGUIDE TYPE 650
 
 
 
B05D PROCESSES FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL 587
 
 
 
C25D PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING 538
 
 
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 251

Top Patents (by citation)

Upgrade to the Premium Level to View Top Patents for this Owner. Learn More

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2014/0340,103 Automated Attaching And Detaching Of An Interchangeable Probe HeadMay 12, 14Nov 20, 14[G01R]
2014/0327,461 Probe Card Assembly For Testing Electronic DevicesMay 05, 14Nov 06, 14[G01R]
2014/0139,250 Contactor Devices With Carbon Nanotube Probes Embedded In A Flexible Film And Processes Of Making SuchNov 20, 12May 22, 14[G01R]
2014/0118,016 Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide HolesOct 31, 12May 01, 14[G01R]
2014/0043,054 VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAYAug 09, 13Feb 13, 14[G01R]
2014/0044,985 PROBE FABRICATION USING COMBINED LASER AND MICRO-FABRICATION TECHNOLOGIESAug 09, 13Feb 13, 14[G01R, B23K]
2013/0271,175 Wiring Substrate With Filled Vias To Accommodate Custom TerminalsApr 03, 13Oct 17, 13[G01R]
2013/0169,301 Probes With Programmable MotionJan 02, 13Jul 04, 13[G01R]
2013/0135,001 Hybrid Electrical ContactorNov 20, 12May 30, 13[G01R]
2013/0093,450 VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATIONDec 04, 12Apr 18, 13[G01R]

View all Publication..

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9,037,432 Wireless probe card verification system and methodMar 13, 12May 19, 15[G01R]
9,030,222 Sharpened, oriented contact tip structuresAug 06, 10May 12, 15[G01R, H01R]
8,896,336 Testing techniques for through-device viasJun 29, 11Nov 25, 14[G01R]
8,872,176 Elastic encapsulated carbon nanotube based electrical contactsOct 05, 11Oct 28, 14[G01R, H01L, B82Y]
8,872,532 Wafer test cassette systemDec 27, 10Oct 28, 14[G01R]
8,872,534 Method and apparatus for testing devices using serially controlled intelligent switchesJul 08, 11Oct 28, 14[G01R]
8,829,937 Fine pitch guided vertical probe array having enclosed probe flexuresJan 27, 11Sep 09, 14[G01R]
8,781,779 Methods and apparatuses for dynamic probe adjustmentNov 09, 12Jul 15, 14[G01C]
8,756,802 Carbon nanotube contact structures for use with semiconductor dies and other electronic devicesDec 31, 12Jun 24, 14[H01R, H01K]
8,760,187 Thermocentric alignment of elements on parts of an apparatusDec 03, 08Jun 24, 14[G01R]

View all patents..

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2011/0171,838 SEGMENTED CONTACTORABANMar 28, 11Jul 14, 11[H05K]
2011/0115,512 Integrated circuit tester with high bandwidth probe assemblyABANJul 12, 05May 19, 11[G01R, H03H]
7,897,435 Re-assembly process for MEMS structuresExpiredMay 25, 06Mar 01, 11[H01L]
7,893,700 Configuration of shared tester channels to avoid electrical connections across die area boundary on a waferExpiredJul 28, 08Feb 22, 11[G01R]
7,893,701 Method and apparatus for enhanced probe card architectureExpiredApr 29, 09Feb 22, 11[G01R]
7,884,006 Method to build a wirebond probe card in a many at a time fashionExpiredDec 02, 08Feb 08, 11[H01R, H01L]
7,880,486 Method and apparatus for increasing operating frequency of a system for testing electronic devicesExpiredAug 19, 08Feb 01, 11[G01R]
7,868,632 Composite motion probingExpiredApr 06, 07Jan 11, 11[G01R]
7,863,915 Probe card cooling assembly with direct cooling of active electronic componentsExpiredAug 25, 09Jan 04, 11[G01R]
7,851,794 Rotating contact element and methods of fabricationExpiredDec 28, 06Dec 14, 10[H01L]
7,845,072 Method and apparatus for adjusting a multi-substrate probe structureExpiredDec 23, 08Dec 07, 10[H05K]
7,836,587 Method of repairing a contactor apparatusExpiredSep 19, 07Nov 23, 10[H01R]
7,834,647 Alignment features in a probing deviceExpiredJul 14, 09Nov 16, 10[G01R]
7,825,652 Method and apparatus for remotely buffering test channelsExpiredNov 18, 08Nov 02, 10[G01R]
7,825,674 Probe card configuration for low mechanical flexural strength electrical routing substratesExpiredJun 30, 06Nov 02, 10[G01R, H01R]
2010/0263,432 METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTORABANApr 23, 10Oct 21, 10[B21D]
2010/0264,949 FLEXURE BAND AND USE THEREOF IN A PROBE CARD ASSEMBLYABANApr 15, 09Oct 21, 10[G01R]
7,814,453 Process and apparatus for finding paths through a routing spaceExpiredOct 23, 03Oct 12, 10[G06F]
2010/0252,317 CARBON NANOTUBE CONTACT STRUCTURES FOR USE WITH SEMICONDUCTOR DIES AND OTHER ELECTRONIC DEVICESABANApr 03, 09Oct 07, 10[H01R, H05K]
7,808,259 Component assembly and alignmentExpiredSep 26, 07Oct 05, 10[G01R]

View all patents..

Top Inventors for This Owner

Upgrade to the Premium Level to View Top Inventors for this Owner. Learn More

We are sorry but your current selection exceeds the maximum number of comparisons () for this membership level. Upgrade to our Level for up to -1 comparisons!

We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level. Upgrade to our Level for up to -1 portfolios!.