FUJITSU VLSI LIMITED

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G11C STATIC STORES 23128
 
  
 
H03K PULSE TECHNIQUE 12119
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 6441
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 6356
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 496
 
  
 
H03F AMPLIFIERS 479
 
  
 
H03M CODING, DECODING OR CODE CONVERSION, IN GENERAL 4107
 
  
 
G11B INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER 3135
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 256
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2126

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6326254 Method of manufacturing semiconductor deviceMay 01, 98Dec 04, 01[H01L]
6222475 Three-step converterJan 11, 96Apr 24, 01[H03M]
6097658 DRAM with reduced electric power consumptionNov 10, 98Aug 01, 00[G11C]
5867438 DRAM with reduced electric power consumptionOct 04, 96Feb 02, 99[G11C]
5841995 Data bus controller having a level setting circuitOct 15, 96Nov 24, 98[H03K]
5789788 Semiconductor device with first and second wells which have opposite conductivity types and a third well region formed on one of the first and second wellsNov 20, 96Aug 04, 98[H01L]
5680064 Level converter for CMOS 3V to from 5VMay 28, 96Oct 21, 97[H03K]
5663889 Apparatus for computing delay time of integrated circuitDec 07, 94Sep 02, 97[G06F]
5652167 Method of liquid treatment of micro-structures comprising structural members liable to be bentJun 29, 93Jul 29, 97[H01L]
5650947 Logic simulation method and logic simulatorJan 24, 95Jul 22, 97[G06F]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6884670 Dry etching with reduced damage to MOS deviceExpiredDec 28, 01Apr 26, 05[H01L]
6251743 Method of liquid treatment of microstructures comprising bendable structural membersExpiredMay 05, 98Jun 26, 01[H01L]
6035111 Manufacturing method and apparatus of a semiconductor integrated circuit deviceExpiredNov 13, 96Mar 07, 00[G06F]
6014329 Flash-erasable semiconductor memory device having an improved reliabilityExpiredDec 05, 97Jan 11, 00[G11C]
5910916 Flash-erasable semiconductor memory device having improved reliabilityExpiredDec 05, 97Jun 08, 99[G11C]
5870337 Flash-erasable semiconductor memory device having an improved reliabilityExpiredDec 05, 97Feb 09, 99[G11C]
5835408 Flash-erasable semiconductor memory device having an improved reliabilityExpiredDec 05, 97Nov 10, 98[G11C]
5835416 Flash-erasable semiconductor memory device having an improved reliabilityExpiredDec 05, 97Nov 10, 98[G11C]
5826099 Data processor having a computing element mounted on a microcontrollerExpiredSep 10, 96Oct 20, 98[G06F]
5764530 Apparatus and method for generating circuit net list from mask pattern dataExpiredMar 06, 95Jun 09, 98[G06F]
5761127 Flash-erasable semiconductor memory device having an improved reliabilityExpiredNov 20, 92Jun 02, 98[G11C]
5731720 Semiconductor integrated circuit device capable of reducing power consumptionExpiredJan 21, 97Mar 24, 98[H03K]
5719812 Semiconductor memory including bit line reset circuitry and a pulse generator having output delay time dependent on type of transition in an input signalExpiredSep 03, 96Feb 17, 98[G11C]
5666335 Apparatus and method for correcting for defective sectors in a recording mediumExpiredAug 29, 94Sep 09, 97[G11B]
5654632 Method for inspecting semiconductor devices on a waferExpiredJul 30, 96Aug 05, 97[G01R]
5640116 PLL circuit of pulse swallow-type prescaler systemExpiredJun 07, 95Jun 17, 97[H03H]
5631113 Electron-beam exposure system for reduced distortion of electron beam spotExpiredMay 05, 95May 20, 97[H01J, G03L]
5620526 In-situ cleaning of plasma treatment chamberExpiredJul 22, 94Apr 15, 97[C09K]
5618744 Manufacturing method and apparatus of a semiconductor integrated circuit deviceExpiredSep 22, 93Apr 08, 97[H01L]
5604723 Method for reading a synchronizing signal from a record medium and an apparatus thereofExpiredJan 17, 91Feb 18, 97[G11B]

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