GATAN, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 2999
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 937
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 5201
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 5357
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 3239
 
  
 
G01T MEASUREMENT OF NUCLEAR OR X-RADIATION 250
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2196
 
  
 
A61K PREPARATIONS FOR MEDICAL, DENTAL, OR TOILET PURPOSES 1254
 
  
 
B01D SEPARATION 1133
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 165

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9696435 Hybrid energy conversion and processing detectorApr 16, 15Jul 04, 17[H01J, G01T]
9415095 Method for image outlier removal for transmission electron microscope camerasJul 30, 15Aug 16, 16[H01J, A61K, C12N]
9196455 Ion beam sample preparation apparatus and methodsJul 27, 14Nov 24, 15[H01J, G01N]
8791438 Ion beam sample preparation apparatus and methodsJul 24, 13Jul 29, 14[H01J]
8729510 Ion beam sample preparation apparatus and methodsApr 21, 13May 20, 14[H01J]
8653489 Ion beam sample preparation apparatus and methodsApr 07, 11Feb 18, 14[G21K]
8610090 Ion beam sample preparation thermal management apparatus and methodsDec 29, 12Dec 17, 13[H01J, G21K]
8592763 Ion beam sample preparation apparatus and methodsAug 30, 12Nov 26, 13[G21K, G01N]
8577171 Method for normalizing multi-gain imagesJul 31, 07Nov 05, 13[G06K]
8542300 Method for real-time removal of vertical scan streaks in a CCDJul 31, 09Sep 24, 13[H04N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0077,106 Ion Beam Sample Preparation Thermal Management Apparatus and MethodsAbandonedNov 17, 13Mar 20, 14[G21F]
2014/0027,632 SYSTEM AND METHOD FOR MEASURING ANGULAR LUMINESCENCE IN A CHARGED PARTICLE MICROSCOPEAbandonedJul 26, 12Jan 30, 14[G01N]
2013/0141,803 APPARATUS FOR COLLECTION OF CATHODOLUMINESCENCE SIGNALSAbandonedDec 01, 11Jun 06, 13[G02B]
2013/0140,459 SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOLUMINESCENCEAbandonedDec 01, 11Jun 06, 13[H01J]
2012/0286,175 COOLED MANIPULATOR TIP FOR REMOVAL OF FROZEN MATERIALAbandonedMay 10, 12Nov 15, 12[G21K, G01N]
2010/0123,077 PASSIVE PIXEL DIRECT DETECTION SENSORAbandonedNov 18, 09May 20, 10[H01J, G01N]
2010/0123,082 METHOD FOR ELECTRON BACK-ILLUMINATION OF A SEMICONDUCTOR IMAGE SENSORAbandonedNov 18, 09May 20, 10[H01L, G01T]
2008/0240,347 METHOD, APPARATUS, AND SYSTEM FOR EXTENDING DEPTH OF FIELD (DOF) IN A SHORT-WAVELENGTH MICROSCOPE USING WAVEFRONT ENCODINGAbandonedJul 24, 06Oct 02, 08[G21K]
2006/0175,013 Specimen surface treatment systemAbandonedFeb 10, 05Aug 10, 06[H01L, B08B, C23F]
2006/0175,014 Specimen surface treatment systemAbandonedJul 28, 05Aug 10, 06[H01L, B08B, C23F]
2006/0175,291 Control of process gases in specimen surface treatment systemAbandonedJul 28, 05Aug 10, 06[B08B, C23F]
2005/0028,657 Tunable cutting deviceAbandonedApr 14, 04Feb 10, 05[B23B]
5097126 High resolution electron energy loss spectrometerExpiredSep 25, 90Mar 17, 92[H01J]
5065029 Cooled CCD camera for an electron microscopeExpiredAug 03, 90Nov 12, 91[H01J]
5009743 Chemically-assisted ion beam milling system for the preparation of transmission electron microscope specimensExpiredNov 06, 89Apr 23, 91[H01L, C03C, B44C]
4996433 Specimen heating holder for electron microscopesExpiredNov 06, 89Feb 26, 91[H01J]
4950901 Specimen cooling holder for side entry transmission electron microscopesExpiredNov 06, 89Aug 21, 90[H01V]
4851670 Energy-selected electron imaging filterExpiredAug 28, 87Jul 25, 89[H01J]
4833330 Anticontaminator for transmission electron microscopesExpiredNov 03, 87May 23, 89[H01J]
4831255 Variable-attenuation parallel detectorExpiredFeb 24, 88May 16, 89[G01T]

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