GLOBALFOUNDRIES SINGAPORE PTE. LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 399116
 
  
 
G11C STATIC STORES 31120
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 19428
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 1490
 
  
 
H02H EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS 1067
 
  
 
B81B MICRO-STRUCTURAL DEVICES OR SYSTEMS, e.g. MICRO-MECHANICAL DEVICES 924
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 9150
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 660
 
  
 
B81C PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICRO-STRUCTURAL DEVICES OR SYSTEMS 626
 
  
 
H01F MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES 678

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0026,076 HIGH DENSITY MULTI-TIME PROGRAMMABLE RESISTIVE MEMORY DEVICES AND METHOD OF FORMING THEREOFSep 14, 17Jan 25, 18[H01L]
2017/0358,744 RESISTIVE MEMORY DEVICEAug 07, 17Dec 14, 17[H01L]
2017/0309,813 INTEGRATED CIRCUITS WITH MAGNETIC TUNNEL JUNCTIONS AND METHODS FOR PRODUCING THE SAMEFeb 27, 17Oct 26, 17[H01L]
2017/0287,978 DOMAIN WALL MAGNETIC MEMORYApr 05, 16Oct 05, 17[H01L, G11C]
2017/0288,131 INTEGRATED HALL EFFECT SENSORS WITH VOLTAGE CONTROLLABLE SENSITIVITYMar 28, 17Oct 05, 17[H01L, G01R]
2017/0162,501 CRACK STOP LAYER IN INTER METAL LAYERSDec 02, 15Jun 08, 17[H01L]
2017/0121,172 INTEGRATED MEMS-CMOS DEVICES AND INTEGRATED CIRCUITS WITH MEMS DEVICES AND CMOS DEVICESJan 13, 17May 04, 17[B81C, B81B]
2017/0092,693 INTEGRATED TWO-TERMINAL DEVICE AND LOGIC DEVICE WITH COMPACT INTERCONNECTS HAVING SHALLOW VIA FOR EMBEDDED APPLICATIONAug 25, 16Mar 30, 17[H01L]
2017/0084,736 HIGH VOLTAGE TRANSISTORSep 17, 15Mar 23, 17[H01L]
2017/0069,619 GATE-GROUNDED METAL OXIDE SEMICONDUCTOR DEVICESep 09, 15Mar 09, 17[H01L]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9922868 Integrated circuits using silicon on insulator substrates and methods of manufacturing the sameMar 19, 15Mar 20, 18[H01L]
9922969 Integrated circuits having transistors with high holding voltage and methods of producing the sameSep 21, 16Mar 20, 18[H01L]
9923137 Magnetic memory with tunneling magnetoresistance enhanced spacer layerMar 04, 16Mar 20, 18[H01L, G11C]
9917027 Integrated circuits with aluminum via structures and methods for fabricating the sameDec 30, 15Mar 13, 18[H01L]
9911665 Integrated circuits, methods of forming the same, and methods of determining gate dielectric layer electrical thickness in integrated circuitsDec 30, 14Mar 06, 18[H01L]
9911867 Fin-based nonvolatile memory structures, integrated circuits with such structures, and methods for fabricating sameJul 01, 16Mar 06, 18[H01L]
9901210 Efficient transfer of materials in manufacturingJan 13, 12Feb 27, 18[G06Q, G05B, A47J]
9905282 Top electrode dome formationMay 30, 17Feb 27, 18[H01L, H01F, G11C]
9905642 Corner transistor suppressionApr 26, 16Feb 27, 18[H01L]
9899514 Extended drain metal-oxide-semiconductor transistorMay 20, 16Feb 20, 18[H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0207,209 INTEGRATED CIRCUITS WITH HIGH VOLTAGE AND HIGH DENSITY CAPACITORS AND METHODS OF PRODUCING THE SAMEAbandonedJan 14, 16Jul 20, 17[H01L]
2016/0322,262 INTEGRATION OF DEVICESAbandonedApr 29, 15Nov 03, 16[H01L]
2016/0268,387 SPLIT-GATE FLASH MEMORY WITH IMPROVED PROGRAM EFFICIENCYAbandonedMar 10, 15Sep 15, 16[H01L]
2016/0190,146 INTEGRATED CIRCUITS AND METHODS FOR FABRICATING MEMORY CELLS AND INTEGRATED CIRCUITSAbandonedDec 29, 14Jun 30, 16[H01L]
2016/0181,197 RELIABLE PASSIVATION LAYERS FOR SEMICONDUCTOR DEVICESAbandonedFeb 29, 16Jun 23, 16[H01L]
2016/0181,440 FIELD EFFECT TRANSISTOR WITH SELF-ADJUSTING THRESHOLD VOLTAGEAbandonedFeb 11, 16Jun 23, 16[H01L]
2016/0172,236 DEVICE SUBSTRATES, INTEGRATED CIRCUITS AND METHODS FOR FABRICATING DEVICE SUBSTRATES AND INTEGRATED CIRCUITSAbandonedDec 12, 14Jun 16, 16[H01L]
2016/0163,724 SCALABLE AND RELIABLE NON-VOLATILE MEMORY CELLAbandonedFeb 03, 16Jun 09, 16[H01L]
2016/0133,637 GUARD RING FOR MEMORY ARRAYAbandonedJan 18, 16May 12, 16[H01L]
2016/0114,457 UNIFORM POLISHING WITH FIXED ABRASIVE PADAbandonedOct 24, 14Apr 28, 16[B24B, H01L]
2016/0093,630 DOUBLE GATED FLASH MEMORYAbandonedDec 10, 15Mar 31, 16[H01L, G11C]
2016/0035,873 FINFET WITH STRESSORSAbandonedOct 12, 15Feb 04, 16[H01L]
2015/0287,780 STRESS ENHANCED HIGH VOLTAGE DEVICEAbandonedJun 22, 15Oct 08, 15[H01L]
2015/0255,471 SPLIT-GATE FLASH MEMORY EXHIBITING REDUCED INTERFERENCEAbandonedMay 20, 15Sep 10, 15[H01L]
2015/0221,565 LAYOUT FOR RETICLE AND WAFER SCANNING ELECTRON MICROSCOPE REGISTRATION OR OVERLAY MEASUREMENTSAbandonedApr 15, 15Aug 06, 15[H01L]
2015/0187,714 INTEGRATED CIRCUITS INCLUDING COPPER PILLAR STRUCTURES AND METHODS FOR FABRICATING THE SAMEAbandonedDec 26, 13Jul 02, 15[H01L]
2015/0123,068 FIN-TYPE MEMORYAbandonedOct 24, 14May 07, 15[H01L]
2015/0048,509 CMOS COMPATIBLE WAFER BONDING LAYER AND PROCESSAbandonedAug 14, 14Feb 19, 15[H01L]
2015/0041,413 FLUID INJECTION FILTRATION SYSTEMAbandonedAug 07, 13Feb 12, 15[B65G, C02F, B01D]
2015/0035,067 LOW RDSON DEVICE AND METHOD OF MANUFACTURING THE SAMEAbandonedJul 31, 14Feb 05, 15[H01L]

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