GLOBALFOUNDRIES SINGAPORE PTE. LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 136230
 
  
 
H02H EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS 1067
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 6441
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 2102
 
  
 
G11C STATIC STORES 2149
 
  
 
H01F MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES 282
 
  
 
H03K PULSE TECHNIQUE 2129
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 165
 
  
 
F04D NON-POSITIVE-DISPLACEMENT PUMPS173
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2014/0048,867 MULTI-TIME PROGRAMMABLE MEMORYAug 20, 12Feb 20, 14[H01L]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9411341 Vacuum pump controllerMay 23, 13Aug 09, 16[H01L, G05D, F04D]
9411919 Method and apparatus for bitcell modelingNov 03, 14Aug 09, 16[G06F]
9406687 Integration of memory devices with different voltagesMar 23, 15Aug 02, 16[H01L]
9397139 Integrated inductor and magnetic random access memory deviceSep 23, 15Jul 19, 16[H01L, H01F]
9397146 Vertical random access memory with selectorsMay 15, 14Jul 19, 16[H01L]
9390962 Methods for fabricating device substrates and integrated circuitsMar 05, 15Jul 12, 16[H01L]
9368386 Corner transistor suppressionJun 26, 13Jun 14, 16[H01L]
9362297 Integrated circuits having improved split-gate nonvolatile memory devices and methods for fabrication of sameDec 29, 14Jun 07, 16[H01L]
9362374 Simple and cost-free MTP structureApr 16, 14Jun 07, 16[H01L, G11C]
9343413 ESD protection for high voltage applicationsMay 18, 12May 17, 16[H01L, H02H]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0349,095 METHODS FOR FABRICATING INTEGRATED CIRCUITS WITH NONVOLATILE MEMORY DEVICESAbandonedJun 03, 14Dec 03, 15[H01L]
2015/0171,008 INTEGRATED CIRCUITS WITH DUMMY CONTACTS AND METHODS FOR PRODUCING SUCH INTEGRATED CIRCUITSAbandonedDec 17, 13Jun 18, 15[H01L]
2015/0129,975 MULTI-TIME PROGRAMMABLE DEVICEAbandonedNov 13, 13May 14, 15[H01L]
2015/0061,085 PACKAGE INTERCONNECTSAbandonedNov 07, 14Mar 05, 15[H01L]
2015/0061,156 PAD SOLUTIONS FOR RELIABLE BONDSAbandonedSep 03, 14Mar 05, 15[H01L]
2015/0008,528 DIFFUSION BARRIER AND METHOD OF FORMATION THEREOFAbandonedSep 25, 14Jan 08, 15[H01L]
2014/0264,733 DEVICE WITH INTEGRATED PASSIVE COMPONENTAbandonedMar 14, 13Sep 18, 14[H01L]
2014/0019,927 WAFERLESS MEASUREMENT RECIPEAbandonedJul 10, 12Jan 16, 14[G06F]
2013/0325,395 CO-OPTIMIZATION OF SCATTEROMETRY MARK DESIGN AND PROCESS MONITOR MARK DESIGNAbandonedJun 01, 12Dec 05, 13[G06F, G01B]
2013/0299,764 LOCALIZED DEVICEAbandonedMay 11, 12Nov 14, 13[H01L]
2013/0292,756 METHOD AND APPARATUS FOR UTILIZING CONTACT-SIDEWALL CAPACITANCE IN A SINGLE POLY NON-VOLATILE MEMORY CELLAbandonedMay 03, 12Nov 07, 13[H01L]
2013/0277,741 LDMOS DEVICE WITH FIELD EFFECT STRUCTURE TO CONTROL BREAKDOWN VOLTAGE, AND METHODS OF MAKING SUCH A DEVICEAbandonedApr 23, 12Oct 24, 13[H01L]
2013/0277,810 METHOD FOR FORMING HEAT SINK WITH THROUGH SILICON VIASAbandonedApr 23, 12Oct 24, 13[H01L]
2013/0252,350 SYSTEM AND METHOD FOR GENERATING CARE AREAS FOR DEFECT INSPECTIONAbandonedMar 26, 12Sep 26, 13[H01L, G06F]
2013/0240,142 ISOLATION BETWEEN A BAFFLE PLATE AND A FOCUS ADAPTERAbandonedMar 15, 12Sep 19, 13[B23P, C23F, B32B]
2013/0187,116 RRAM Device With Free-Forming Conductive Filament(s), and Methods of Making SameAbandonedJan 19, 12Jul 25, 13[H01L, B82Y]
2013/0119,543 THROUGH SILICON VIA FOR STACKED WAFER CONNECTIONSAbandonedNov 16, 11May 16, 13[H01L]
2013/0087,889 DIFFUSION BARRIER AND METHOD OF FORMATION THEREOFAbandonedNov 29, 12Apr 11, 13[H01L]
2013/0082,332 METHOD FOR FORMING N-TYPE AND P-TYPE METAL-OXIDE-SEMICONDUCTOR GATES SEPARATELYAbandonedSep 30, 11Apr 04, 13[H01L]
2013/0034,954 INTEGRATED CIRCUIT SYSTEM INCLUDING NITRIDE LAYER TECHNOLOGYAbandonedOct 08, 12Feb 07, 13[H01L]

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