HEMLOCK SEMICONDUCTOR CORPORATION
Patent Owner
Stats
- 21 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Feb 16, 2016 most recent publication
Details
- 21 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 415 Total Citation Count
- Mar 25, 1988 Earliest Filing
- 22 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
- No Recent Publications to Display
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9261464 Applying edge-on photoluminescence to measure bulk impurities of semiconductor materialsJun 03, 11Feb 16, 16[G01J, G01N]
8951352 Manufacturing apparatus for depositing a material and an electrode for use thereinApr 13, 09Feb 10, 15[C23C, C01B, H01L, H05B, H01R, C23F]
8895324 Method of determining an amount of impurities that a contaminating material contributes to high purity siliconApr 10, 12Nov 25, 14[C01B, F27B, F27D, G01R, C30B]
8784565 Manufacturing apparatus for depositing a material and an electrode for use thereinApr 13, 09Jul 22, 14[C23C, H01L, H05B, C23F]
8609058 Silicon production with a fluidized bed reactor integrated into a Siemens-type processMar 21, 11Dec 17, 13[C01B, F27B, B01J]
8021483 Flowable chips and methods for the preparation and use of same, and apparatus for use in the methodsNov 14, 02Sep 20, 11[C30B]
7935327 Silicon production with a fluidized bed reactor integrated into a siemens-type processAug 30, 06May 03, 11[C01B]
7927984 Silicon production with a fluidized bed reactor utilizing tetrachlorosilane to reduce wall depositionNov 05, 08Apr 19, 11[H01L]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2014/0353,290 ELECTRODE FOR USE WITH A MANUFACTURING APPARATUS FOR DEPOSITING A MATERIALAbandonedAug 12, 14Dec 04, 14[B23K]
2014/0225,030 METHOD OF CONTROLLING THE CRYSTALLINITY OF A SILICON POWDERAbandonedFeb 13, 14Aug 14, 14[C01B]
2014/0220,347 ELECTRODE COMPOSITION COMPRISING A SILICON POWDER AND METHOD OF CONTROLLING THE CRYSTALLINITY OF A SILICON POWDERAbandonedAug 14, 12Aug 07, 14[C01B, H01M]
2012/0199,068 MANUFACTURING APPARATUS FOR DEPOSITING A MATERIAL AND AN ELECTRODE FOR USE THEREINAbandonedOct 08, 10Aug 09, 12[C23C, H01B]
2012/0114,860 METHOD OF INHIBITING FORMATION OF DEPOSITS IN A MANUFACTURING SYSTEMAbandonedJul 14, 10May 10, 12[B05D]
2012/0070,362 QUANTITATIVE MEASUREMENT OF GAS PHASE PROCESS INTERMEDIATES USING RAMAN SPECTROSCOPYAbandonedMay 11, 10Mar 22, 12[C01B, G01N]
2011/0250,116 Process for Producing Trichlorosilane and TetrachlorosilaneAbandonedNov 17, 09Oct 13, 11[C01B]
2011/0228,268 Method Of Analyzing A Composition Containing ImpuritiesAbandonedNov 16, 09Sep 22, 11[G01J, G01N]
2011/0036,292 Manufacturing Apparatus For Depositing A Material And An Electrode For Use ThereinAbandonedApr 13, 09Feb 17, 11[C23C]
6605149 Method of stacking polycrystalline silicon in process for single crystal productionExpiredJan 11, 02Aug 12, 03[C30B]
5529935 Method for determining organoamines concentrations in chlorosilaneExpiredMay 17, 95Jun 25, 96[G01N]
5361128 Method for analyzing irregular shaped chunked silicon for contaminatesExpiredSep 10, 92Nov 01, 94[G01N]
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