HITACHI ELECTRONICS ENGINEERING CO., LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 11195
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS396
 
  
 
G11B INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER 3135
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 264
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 276
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8072597 Method and its apparatus for inspecting particles or defects of a semiconductor deviceJun 13, 08Dec 06, 11[G01N]
6888918 Surface inspection method and surface inspection apparatusNov 18, 03May 03, 05[G01B]
6798504 Apparatus and method for inspecting surface of semiconductor wafer or the likeSep 24, 01Sep 28, 04[G01N]
6330059 Optical system for detecting surface defects, a disk tester and a disk testing methodOct 26, 00Dec 11, 01[G01N]
6295131 Interference detecting system for use in interferometerFeb 18, 99Sep 25, 01[G01B]
6132578 Method and apparatus for electrophoresis separation and detectionJun 23, 97Oct 17, 00[G01N]
6057926 Magnetic disk testing method and surface defect testing deviceJun 23, 98May 02, 00[G01N]
5998994 MR head offset correction method and magnetic disk certifierJan 29, 98Dec 07, 99[G11B]
5936789 Off-track tester for testing MR head and method of testing the sameJul 29, 97Aug 10, 99[G11B]
5898491 Surface defect test method and surface defect testerMar 27, 98Apr 27, 99[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7499157 System for monitoring foreign particles, process processing apparatus and method of electronic commerceExpiredMar 23, 07Mar 03, 09[G01N]
6893329 Polishing apparatus with abrasive tape, polishing method using abrasive tape and manufacturing method for magnetic diskExpiredSep 05, 03May 17, 05[B24B]
6821906 Method and apparatus for treating surface of substrate plateExpiredNov 20, 01Nov 23, 04[C23C, H01L, H05H]
6815198 Apparatus for automated preparation of DNA samples and reactor for preparing DNA samplesExpiredApr 26, 01Nov 09, 04[C12M]
6790300 Method and apparatus for bonding substrate plates together through gap-forming sealer materialExpiredSep 14, 01Sep 14, 04[B32B]
2004/0045,575 Apparatus and method for processing a substrateAbandonedSep 10, 03Mar 11, 04[B08B]
6700369 Testing apparatus of magnetic recording medium or magnetic head including a plurality of analog-to-digital converters which convert reproduced testing data into digital dataExpiredNov 28, 00Mar 02, 04[G01R]
6642734 Method and apparatus to generate a ground level of a semiconductor IC tester having a plurality of substratesExpiredNov 06, 00Nov 04, 03[G01R]
6631726 Apparatus and method for processing a substrateExpiredAug 04, 00Oct 14, 03[B08B]
6628402 Phase interference detecting method and system in interferometer, and light detector thereforExpiredOct 08, 99Sep 30, 03[G01B]
6617603 Surface defect testerExpiredMar 01, 02Sep 09, 03[G01N]
6600561 Apparatus and method for measuring pattern alignment errorExpiredJun 26, 01Jul 29, 03[G01B]
6552535 Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuitExpiredSep 26, 01Apr 22, 03[G01R]
6515470 Method and apparatus for testing IC deviceExpiredMar 12, 01Feb 04, 03[G01R]
6515945 Recording media library apparatus with a function to detect a position of a recording medium transferred in the libraryExpiredMar 10, 99Feb 04, 03[G11B]
6509966 Optical system for detecting surface defect and surface defect tester using the sameExpiredJul 19, 01Jan 21, 03[G01N]
2002/0180,959 Optical system for detecting surface defects and disk tester and disk testing method utilizing the same optical systemAbandonedMay 23, 02Dec 05, 02[G01N]
6480971 Media library apparatus and method of controlling the media library apparatusExpiredNov 23, 99Nov 12, 02[G06F]
6473258 Magnetic disk read/write circuit having core coils of opposite phaseExpiredSep 15, 00Oct 29, 02[G11B]
6448799 Timing adjustment method and apparatus for semiconductor IC testerExpiredJun 20, 00Sep 10, 02[G01R]

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