HITACHI HIGH-TECHNOLOGIES CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology MATTERS Rank in Class
 
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 981 2
 
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 744 1
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 215 62
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 212 182
 
 
G06F ELECTRIC DIGITAL DATA PROCESSING 108 339
 
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 106 4
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 90 24
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 73 67
 
 
B01L CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE 66 10
 
 
2401 APPARATUS AND EQUIPMENT FOR DOCTORS, HOSPITALS AND LABORATORIES 62 4
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Top Patents (by citation)

Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2018/0074,085 SPECIMEN CONVEYANCE DEVICE AND SPECIMEN PROCESSING SYSTEM Feb 26, 16 Mar 15, 18 [G01N]
2018/0076,004 Charged Particle Beam Device and Sample Observation Method Apr 14, 15 Mar 15, 18 [H01J]
2018/0068,835 PLASMA PROCESSING APPARATUS Feb 20, 17 Mar 08, 18 [C23C, H01J]
2018/0059,055 Electrophoresis Device and Electrophoresis Method Mar 27, 15 Mar 01, 18 [G01N]
2018/0052,183 Inspection Device Feb 01, 16 Feb 22, 18 [G01N]
2018/0045,571 OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD Mar 11, 15 Feb 15, 18 [G01J, G01N]
2018/0047,595 PLASMA PROCESSING DEVICE AND PLASMA PROCESSING METHOD USING SAME Apr 27, 16 Feb 15, 18 [H01J, H01L]
2018/0037,930 Nucleic Acid Analyzer Feb 23, 15 Feb 08, 18 [B01L, C12Q]
2018/0038,881 SAMPLE TRANSPORT APPARATUS Oct 17, 17 Feb 08, 18 [G01N]
2018/0040,459 PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD Feb 06, 17 Feb 08, 18 [H01J]

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9921160 Multichannel analysis device Jun 23, 15 Mar 20, 18 [G01N]
9921195 Liquid chromatography-mass spectrometry device Dec 05, 14 Mar 20, 18 [H01J, G01N]
9922414 Defect inspection method and defect inspection device Jan 27, 14 Mar 20, 18 [G06T, H01L, G06K]
9922798 Sample processing method and charged particle beam device May 09, 14 Mar 20, 18 [H01J]
9915672 Automatic analyzer Jan 13, 16 Mar 13, 18 [G01N]
D812578 Upper chamber for a plasma processing apparatus Jul 26, 16 Mar 13, 18 [1303]
9905393 Stage apparatus with braking system for lens, beam, or vibration compensation Mar 21, 16 Feb 27, 18 [G21K, H01J, H01L]
9905431 Dry etching method Jul 31, 14 Feb 27, 18 [B44C, C03C, H01L]
9897519 Automatic analyzer and method for washing sample-pipetting probe Dec 14, 12 Feb 20, 18 [G01N]
9897622 Automatic analyzer Apr 01, 14 Feb 20, 18 [B08B, G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2017/0230,271 DATA MANAGEMENT APPARATUS AND MONITORING METHOD OF SAME Abandoned Aug 26, 16 Aug 10, 17 [H04L]
2016/0379,797 Charged Particle Beam Apparatus Abandoned Jun 25, 14 Dec 29, 16 [H01J]
2016/0299,167 Analyzer Abandoned Dec 10, 14 Oct 13, 16 [C12Q, G01N]
2016/0195,563 AUTOMATED ANALYZER Abandoned Jul 29, 14 Jul 07, 16 [G01N]
2016/0181,118 PLASMA PROCESSING METHOD Abandoned Sep 11, 15 Jun 23, 16 [H01L]
2016/0168,525 Cell Culturing Method, Particulate Culture Carrier, and Particle-Encompassing Cell Aggregate Abandoned May 09, 14 Jun 16, 16 [C12N, C12M]
2016/0079,055 SAMPLE CLEANING APPARATUS AND SAMPLE CLEANING METHOD Abandoned Feb 19, 15 Mar 17, 16 [B08B, H01L, B06B]
2016/0079,073 PLASMA PROCESSING METHOD Abandoned Feb 19, 15 Mar 17, 16 [H01L]
2015/0367,348 NUCLEIC ACID AMPLIFYING DEVICE AND METHOD FOR DETECTING ABNORMAL TEMPERATURE REGULATING FUNCTION Abandoned Jan 27, 14 Dec 24, 15 [B01L]
2015/0355,105 Inspection Apparatus Abandoned Dec 19, 13 Dec 10, 15 [G01N]
2015/0308,986 SAMPLE INJECTION DEVICE Abandoned Oct 21, 13 Oct 29, 15 [H01J, G01N]
2015/0293,034 INSPECTION DEVICE AND INSPECTION METHOD Abandoned Oct 23, 13 Oct 15, 15 [G01J, G01N]
2015/0276,557 STATE MONITORING SYSTEM, STATE MONITORING METHOD AND MEDIUM Abandoned Mar 27, 15 Oct 01, 15 [G01M]
2015/0277,237 IMAGE PROCESSOR, METHOD FOR GENERATING PATTERN USING SELF- ORGANIZING LITHOGRAPHIC TECHNIQUES AND COMPUTER PROGRAM Abandoned Nov 14, 13 Oct 01, 15 [G03F]
2015/0278,325 INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, INFORMATION SYSTEM AND MEDIUM Abandoned Mar 27, 15 Oct 01, 15 [G06F]
2015/0270,148 ETCHING APPARATUS Abandoned Feb 20, 15 Sep 24, 15 [H01J, H01L]
2015/0243,472 Electron Microscope and Sample Movement Device Abandoned Jun 26, 13 Aug 27, 15 [H01J]
2015/0212,105 ANALYSIS SYSTEM AND ANALYSIS METHOD Abandoned Jul 08, 13 Jul 30, 15 [G01N]
2015/0213,999 Charged Particle Beam Apparatus Abandoned Jul 01, 13 Jul 30, 15 [H01J]
2015/0206,705 MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE AND DIAPHRAGM MEMBER Abandoned Jul 11, 13 Jul 23, 15 [H01J]

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