HUNGARIAN ACADEMY OF SCIENCES RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
7133140 Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfacesApr 01, 04Nov 07, 06[G01B]

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