HYSITRON, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 27179
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS1386
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]513
 
  
 
B82Y SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES548
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 3125
 
  
 
H05B ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR 3108
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 258
 
  
 
G01L MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 254
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 155
 
  
 
B43L ARTICLES FOR WRITING OR DRAWING UPON; ACCESSORIES FOR WRITING OR DRAWING 18

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9902027 Instrument changing assembly and methodsAug 01, 14Feb 27, 18[B23P, G01N, G01Q, G01D]
9829417 Environmental conditioning assembly for use in mechanical testing at micron or nano-scalesMar 14, 13Nov 28, 17[G01N, F28F, G01B]
9804072 High temperature heating systemNov 28, 12Oct 31, 17[H05B, G01N]
9759641 Micro electro-mechanical heaterNov 23, 15Sep 12, 17[H01J, H05B, G01N]
9476816 Probe tip heating assemblyNov 14, 12Oct 25, 16[H05B, G01N, G01Q]
9472374 Testing assembly including a multiple degree of freedom stageSep 28, 12Oct 18, 16[H01J, G21K, G01N, G02B]
9404841 Microelectromechanical transducer and test systemNov 26, 12Aug 02, 16[G01N, G01Q, G01B]
9335240 Method of measuring an interaction forceNov 28, 12May 10, 16[B82Y, G01N, G01Q]
9316569 Micro electro-mechanical heaterAug 26, 10Apr 19, 16[H01J, G01N]
9304072 Micromachined comb drive for quantitative nanoindentationApr 24, 12Apr 05, 16[B82Y, G01N, G01Q, G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0075,264 MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENTAbandonedMar 13, 13Mar 19, 15[G01N, G02B, G01Q]
2001/0013,574 INTERMITTENT CONTACT IMAGING UNDER FORCE-FEEDBACK CONTROLAbandonedNov 10, 98Aug 16, 01[G01B]

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