ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 9151
 
  
 
G21K TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES 1432
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 11195
 
  
 
A61N ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY 4103
 
  
 
G21G CONVERSION OF CHEMICAL ELEMENTS; RADIOACTIVE SOURCES 413
 
  
 
H01T SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES 422
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360
 
  
 
B01D SEPARATION 1133
 
  
 
F16K VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING172
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9847208 Electron beam device, cold field emitter, and method for regeneration of a cold field emitterAug 10, 16Dec 19, 17[H01J]
9805908 Signal charged particle deflection device, signal charged particle detection system, charged particle beam device and method of detection of a signal charged particle beamFeb 16, 16Oct 31, 17[H01J]
9805908 Signal charged particle deflection device, signal charged particle detection system, charged particle beam device and method of detection of a signal charged particle beamFeb 16, 16Oct 31, 17[H01J]
9754759 Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole deviceNov 20, 15Sep 05, 17[H01J]
9697983 Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam deviceFeb 29, 16Jul 04, 17[H01J]
9673017 Housing device for magnetic shielding, housing arrangement for magnetic shielding, charged particle beam device, and method of manufacturing a housing deviceNov 20, 15Jun 06, 17[H01J]
9666404 Charged particle source arrangement for a charged particle beam device, charged particle beam device for sample inspection, and method for providing a primary charged particle beam for sample inspection in a charged particle beamFeb 10, 16May 30, 17[H01J]
9666405 System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam deviceFeb 18, 16May 30, 17[H01J]
9666406 Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam deviceFeb 18, 16May 30, 17[H01J]
9633815 Emitter for an electron beam, electron beam device and method for producing and operating an electron emitterFeb 10, 16Apr 25, 17[H01J, H01L]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2015/0228,452 SECONDARY ELECTRON OPTICS AND DETECTION DEVICEAbandonedApr 17, 15Aug 13, 15[H01J]
2014/0264,062 HIGH THROUGHPUT SCAN DEFLECTOR AND METHOD OF MANUFACTURING THEREOFAbandonedJul 02, 13Sep 18, 14[H01J]
2014/0175,277 SECONDARY ELECTRON OPTICS AND DETECTION DEVICEAbandonedJan 04, 13Jun 26, 14[H01J]
2013/0320,228 CONTAMINATION REDUCTION ELECTRODE FOR PARTICLE DETECTORAbandonedJul 06, 12Dec 05, 13[H01J]
2013/0306,863 ELEMENT FOR FAST MAGNETIC BEAM DEFLECTIONAbandonedMay 16, 13Nov 21, 13[H01J]
2013/0214,155 CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERATING THEREOFAbandonedFeb 27, 12Aug 22, 13[H01J]
2012/0091,359 SIMPLIFIED PARTICLE EMITTER AND METHOD OF OPERATING THEREOFAbandonedOct 22, 10Apr 19, 12[H01J]
2011/0315,890 GAS ION SOURCE WITH HIGH MECHANICAL STABILITYAbandonedSep 07, 11Dec 29, 11[H01J, B23P]
2011/0139,978 CHARGED PARTICLE BEAM DEVICE, METHOD OF OPERATING A CHARGED PARTICLE BEAM DEVICEAbandonedDec 07, 10Jun 16, 11[G21K, G01N]
2010/0006,447 METHOD OF PREPARING AN ULTRA SHARP TIP, APPARATUS FOR PREPARING AN ULTRA SHARP TIP, AND USE OF AN APPARATUSAbandonedJul 08, 08Jan 14, 10[C23C, C25D, B05D]
2008/0283,745 EMITTER CHAMBER, CHARGED PARTICAL APPARATUS AND METHOD FOR OPERATING SAMEAbandonedApr 18, 08Nov 20, 08[G01N]
2008/0284,332 GUN CHAMBER, CHARGED PARTICLE BEAM APPARATUS AND METHOD OF OPERATING SAMEAbandonedApr 18, 08Nov 20, 08[H01J]
2008/0135,786 ADJUSTABLE APERTURE ELEMENT FOR PARTICLE BEAM DEVICE, METHOD OF OPERATING AND MANUFACTURING THEREOFAbandonedOct 24, 07Jun 12, 08[G21K]
2008/0073,583 ION BEAM APPARATUS AND METHOD FOR ALIGNING SAMEAbandonedFeb 16, 07Mar 27, 08[H01J]
2007/0145,303 Protecting Aperture for Charged Particle EmitterAbandonedOct 26, 06Jun 28, 07[G21K]
2007/0138,404 Chamber with low electron stimulated desorptionAbandonedSep 09, 04Jun 21, 07[G01K]
2007/0018,562 Field emitter arrangement and method of cleansing an emitting surface of a field emitterAbandonedJul 20, 06Jan 25, 07[H01J]
2007/0001,574 CONTINUOUSLY CLEANING OF THE EMISSION SURFACE OF A COLD FIELD EMISSION GUN USING UV OR LASER BEAMSAbandonedJun 26, 06Jan 04, 07[H01J]
2006/0226,753 Stabilized emitter and method for stabilizing sameAbandonedMar 22, 06Oct 12, 06[H01J]
2003/0131,467 Method and device for manufacturing of saddle coilsAbandonedNov 05, 02Jul 17, 03[H01F]

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