INFINEON TECHNOLOGIES NORTH AMERICA CORP.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 16346
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 5154
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 4443
 
  
 
G05F SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES 397
 
  
 
G11C STATIC STORES 2149
 
  
 
H02M APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF 2100
 
  
 
H03L AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES 278
 
  
 
A01H NEW PLANTS OR PROCESSES FOR OBTAINING THEM; PLANT REPRODUCTION BY TISSUE CULTURE TECHNIQUES 1127
 
  
 
B01F MIXING, e.g. DISSOLVING, EMULSIFYING, DISPERSING 141
 
  
 
C30B SINGLE-CRYSTAL GROWTH 155

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9570979 Voltage regulator with power stage sleep modesApr 17, 14Feb 14, 17[H02M, G05F]
9436190 Sensor circuit for detecting the setting of an integrated circuitOct 14, 13Sep 06, 16[G01R, G05F]
9293407 Semiconductor package having a baseplate with a die attach region and a peripheral regionNov 03, 14Mar 22, 16[H01L]
9269594 High power ceramic on copper packageJan 05, 12Feb 23, 16[H01L]
8916474 Semiconductor modules and methods of formation thereofFeb 18, 13Dec 23, 14[H01L]
8822342 Method to reduce depth delta between dense and wide features in dual damascene structuresDec 30, 10Sep 02, 14[H01L]
8598853 Method of balancing current supplied to a loadJul 07, 11Dec 03, 13[H02J]
8236699 Contact patterning method with transition etch feedbackFeb 07, 11Aug 07, 12[H01L]
8234501 System and method of controlling access to a deviceNov 30, 07Jul 31, 12[G06F]
8102174 Techniques for electrically characterizing tunnel junction film stacks with little or no processingJan 29, 09Jan 24, 12[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7998828 Method of forming metal ion transistorExpiredMar 17, 10Aug 16, 11[H01L]
8001004 System and method for brokering the sale of internet advertisement inventoryExpiredJul 30, 08Aug 16, 11[G06Q]
7670901 Method of fabricating a bottle trench and a bottle trench capacitorExpiredFeb 20, 08Mar 02, 10[H01L]
2009/0242,989 COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR DEVICE WITH EMBEDDED STRESSORAbandonedMar 25, 08Oct 01, 09[H01L]
7514705 Phase change memory cell with limited switchable volumeExpiredApr 25, 06Apr 07, 09[H01L]
2009/0027,943 RESISTIVE MEMORY INCLUDING BIDIRECTIONAL WRITE OPERATIONAbandonedJul 24, 07Jan 29, 09[G11C]
2008/0266,990 Flexible redundancy replacement scheme for semiconductor deviceAbandonedApr 30, 07Oct 30, 08[G11C]
2008/0247,218 DESIGN STRUCTURE FOR IMPLEMENTING IMPROVED WRITE PERFORMANCE FOR PCRAM DEVICESAbandonedSep 06, 07Oct 09, 08[G11C]
2008/0173,975 PROGRAMMABLE RESISTOR, SWITCH OR VERTICAL MEMORY CELLAbandonedJan 22, 07Jul 24, 08[H01L]
2008/0020,491 MAGNETICIALLY LINED CONDUCTORSAbandonedJul 30, 07Jan 24, 08[H01L]
7252387 System and method for mechanically adjusting projector pose with six degrees of freedom for image alignmentExpiredMar 21, 05Aug 07, 07[G03B]
2007/0140,032 Sensing Current Recycling Method During Self-RefreshAbandonedFeb 21, 07Jun 21, 07[G11C]
7091553 Top oxide nitride liner integration scheme for vertical DRAMExpiredApr 19, 05Aug 15, 06[H01L]
2006/0168,470 Random access memory with post-amble data strobe signal noise rejectionAbandonedMar 23, 06Jul 27, 06[G06F]
2006/0110,685 Apparatus and method to improve resist line roughness in semiconductor wafer processingAbandonedJan 10, 06May 25, 06[G03F]
6987042 Method of forming a collar using selective SiGe/Amorphous Si EtchExpiredMay 30, 03Jan 17, 06[H01L]
6929964 Method of monitoring introduction on interfacial speciesExpiredSep 17, 03Aug 16, 05[H01L]
6897107 Method for forming TTO nitride liner for improved collar protection and TTO reliabilityExpiredNov 24, 03May 24, 05[H01L]
6887761 Vertical semiconductor devicesExpiredMar 17, 04May 03, 05[H01I, H01L]
2005/0014,364 Method of suppressing the effect of shining spots present at the edge of a waferAbandonedJul 18, 03Jan 20, 05[H01L, B32B]

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