ISMECA SEMICONDUCTOR HOLDING SA

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS495
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 4155
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 2445
 
  
 
B07C POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING 126
 
  
 
B23P OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 155
 
  
 
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 166
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 1241

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2017/0276,721 PROCESS AND ASSEMBLY FOR TESTING ELECTRICAL AND OPTICAL PARAMETERS OF A PLURALITY OF LIGHT-EMITTING DEVICESSep 30, 15Sep 28, 17[G01R]
2017/0276,722 ASSEMBLY AND METHOD FOR TESTING OPTICAL DEVICESOct 23, 15Sep 28, 17[G01R, G01B]
2016/0327,429 LIGHT EMISSION TESTING DEVICE WITH A SHUTTERAug 20, 14Nov 10, 16[G01J]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9523710 Electrical component testing nestDec 05, 12Dec 20, 16[G01R]
9521793 Method and device for filling carrier tapes with electronic componentsJun 03, 11Dec 13, 16[G06F, H05K]
9153470 Wafer handler comprising a vision systemJun 12, 12Oct 06, 15[H01L, H04N]
9140629 Assembly for testing the performance of a componentJul 11, 13Sep 22, 15[G01M, G01R]
8550766 Method and device for aligning componentsJun 21, 10Oct 08, 13[B65G]
8280543 Arrangement and method for handling electronic componentsJul 12, 10Oct 02, 12[G06F]
7716819 Device and method for turning over electronic componentsMay 14, 08May 18, 10[B23P, B07C, B08B]
RE39978 Scanning phase measuring method and system for an object at a vision stationJul 08, 98Jan 01, 08[G01B]
7283235 Optical device and inspection moduleFeb 14, 05Oct 16, 07[G01B]
5646733 Scanning phase measuring method and system for an object at a vision stationJan 29, 96Jul 08, 97[G01B]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2014/0298,634 COMPONENT HANDLING ASSEMBLYAbandonedDec 07, 11Oct 09, 14[B23P]
2014/0028,833 INSPECTION DEVICEAbandonedMar 05, 12Jan 30, 14[G01N]
8439292 Auto-reel changerExpiredMay 03, 11May 14, 13[B65H]
7442000 Method and device for extracting electronic components from tubes and electronic component feeding deviceExpiredSep 14, 04Oct 28, 08[B65G]
6956963 Imaging for a machine-vision systemExpiredJan 08, 01Oct 18, 05[G06K]
2005/0115,800 Method for adjusting barrel supports and barrelAbandonedDec 03, 04Jun 02, 05[B65G, F41A]
2005/0011,027 Contact actuator with contact force controlAbandonedAug 16, 04Jan 20, 05[G01R]
6603103 Circuit for machine-vision systemExpiredJul 08, 99Aug 05, 03[G01J]
6522777 Combined 3D- and 2D-scanning machine-vision system and methodExpiredJul 08, 99Feb 18, 03[G06K]
6509559 Binary optical grating and method for generating a moire pattern for 3D imagingExpiredJun 20, 00Jan 21, 03[H01J]
6501554 3D scanner and method for measuring heights and angles of manufactured partsExpiredJun 20, 00Dec 31, 02[G01B]

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