J.A. WOOLLAM CO., INC.
Patent Owner
Stats
- 186 US PATENTS IN FORCE
- 1 US APPLICATIONS PENDING
- Mar 20, 2018 most recent publication
Details
- 186 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 2,716 Total Citation Count
- Sep 18, 1992 Earliest Filing
- 6 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
Intl Class
Technology
Matters
Rank in Class
Top Patents (by citation)
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Recent Publications
Publication #
Title
Filing Date
Pub Date
Intl Class
2014/0204,203 Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meets scheimpflug condition and overcomes keystone errorMar 13, 13Jul 24, 14[G01N]
Recent Patents
Patent #
Title
Filing Date
Issue Date
Intl Class
9921395 Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam areaNov 18, 16Mar 20, 18[G01N, G02B]
9851294 Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of useJun 24, 15Dec 26, 17[G01J, G01N]
9658151 System for viewing samples that are undergoing ellipsometric investigation in real timeFeb 06, 15May 23, 17[H04N, G01N]
9599569 Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflectionApr 28, 16Mar 21, 17[C23C, H05B, G01M, G01N, G02B]
9546943 System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressureMar 18, 16Jan 17, 17[G01N]
9360369 System for determining average ellipsometric parameters for planar or non-planar shaped objects, and method of its useJun 20, 15Jun 07, 16[G01J]
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
2014/0356,520 Method to enhance sensitivity to surface-normal optical functions of anisotropic films using attenuated total reflectionAbandonedMay 22, 14Dec 04, 14[G01N]
6657888 Application of high spin polarization materials in two terminal non-volatile bistable memory devicesExpiredApr 30, 02Dec 02, 03[G11C]
2001/0046,089 Spatial filter source beam conditioning in ellipsometer and the like systemsAbandonedMay 14, 01Nov 29, 01[G02B]
Top Inventors for This Owner
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