JAPAN ELECTRONIC MATERIALS CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 13146
 
 
 
C25D PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING 249
 
 
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 2131
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
 
 
1402 DATA PROCESSING EQUIPMENT AS WELL AS PERIPHERAL APPARATUS AND DEVICES162

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9841438 Guide plate for a probe card and probe card provided with sameNov 22, 16Dec 12, 17[C25D, G01R]
9774121 Contact probeNov 27, 13Sep 26, 17[H01R, G01R]
9535096 Guide plate for a probe card and probe card provided with sameJul 25, 13Jan 03, 17[C25D, G01R]
9523716 Probe guide plate and method for manufacturing the sameMar 10, 14Dec 20, 16[G01R]
9459287 Guide plate for probe cardMar 12, 14Oct 04, 16[G01R]
D751555 Probe card caseSep 03, 13Mar 15, 16[1402]
8456171 Semiconductor test system and relay driving test method thereforOct 16, 09Jun 04, 13[G01R]
8159659 Optical device inspecting apparatusNov 09, 07Apr 17, 12[G01B]
7692438 Bimetallic probe with tip endMay 19, 05Apr 06, 10[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0265,073 Probe Card And Manufacturing Method ThereforAbandonedJan 16, 11Oct 10, 13[G01R]
2013/0105,212 MULTILAYER INSULATING SUBSTRATE AND METHOD FOR MANUFACTURING THE SAMEAbandonedNov 02, 12May 02, 13[H05K]
2011/0291,685 PROBEAbandonedMar 19, 09Dec 01, 11[G01R]
2009/0174,422 Probe Card and Manufacturing Method ThereofAbandonedSep 08, 06Jul 09, 09[G01R, H05K]
7106080 Probe card and contactor of the sameExpiredSep 29, 05Sep 12, 06[G01R]
7081766 Probe card for examining semiconductor devices on semiconductor wafersExpiredJun 17, 04Jul 25, 06[G01R]
6967493 Probe card and contactor of the sameExpiredAug 25, 04Nov 22, 05[G01R]
2005/0093,559 Connection pinAbandonedSep 27, 04May 05, 05[G01R]
2005/0036,374 Probe card substrateAbandonedAug 09, 04Feb 17, 05[G11C]
2004/0040,739 Multilayer wiring board and method of manufacturing the sameAbandonedSep 03, 02Mar 04, 04[H05K]
2002/0153,913 Probe for the probe cardAbandonedNov 27, 01Oct 24, 02[G01R]
6013169 Method of reforming a tip portion of a probeExpiredMar 09, 98Jan 11, 00[C25D]
5827524 Antimicrobial polymer compositionExpiredJan 11, 96Oct 27, 98[A61K]
5753250 Crystalline antimicrobial compositionExpiredJan 11, 96May 19, 98[A61K, A01N]
5698212 Antimicrobial polymer compositionExpiredMar 12, 96Dec 16, 97[A01N]
5413789 Antimicrobial composition of aluminosilicate coated silica gelExpiredMay 17, 93May 09, 95[A01N]
5298252 Antimicrobial composition having resistance to heat and weathersExpiredAug 29, 91Mar 29, 94[A01N, B32B]
5244667 Silica-gel based antimicrobial composition having an antimicrobial coat of aluminosilicate on the surface of silica gelExpiredFeb 28, 91Sep 14, 93[A01N]
4523144 Complex probe card for testing a semiconductor waferExpiredMay 21, 81Jun 11, 85[G01R]
4518914 Testing apparatus of semiconductor wafersExpiredAug 02, 82May 21, 85[G01R]

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