JASCO CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1860
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 17189
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 6122
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS594
 
  
 
G01L MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 254
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 2203
 
  
 
B01D SEPARATION 1133
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1158
 
  
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 1132
 
  
 
G03H HOLOGRAPHIC PROCESSES OR APPARATUS 131

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9335308 Chromatography system, signal processing apparatus, chromatography data processing apparatus, and programMar 12, 14May 10, 16[G01J, G01N]
9267887 High-pressure fluorescence flow cell, flow cell assembly, fluorescence detector, and supercritical fluid chromatographDec 07, 12Feb 23, 16[G01N, B01D]
8915261 Pressure control apparatus for supercritical fluidOct 27, 10Dec 23, 14[G01N, G05D, B01D]
8863578 Very-small-capacity pressure gaugeSep 29, 11Oct 21, 14[G01L]
8797533 Depolarizer and circular dichroism spectrometer using the sameDec 27, 12Aug 05, 14[G01J]
8763447 Ultraviolet curing resin property measuring apparatusApr 13, 11Jul 01, 14[G01N]
8749780 Circular dichroism spectrometer having alignment mechanismMar 28, 13Jun 10, 14[G01J]
8531674 Microscopic total reflection measuring apparatusApr 20, 10Sep 10, 13[G01J, G01B]
8327725 Sample collection container, sample collection apparatus, and sample collection method in supercritical fluid systemSep 26, 09Dec 11, 12[G01N, B01D]
8243290 Three-dimensional base setting method for image dataApr 13, 10Aug 14, 12[G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0293,887 Solution Sample Holding Method, Sample Cell, And Circular Dichroism Measuring ApparatusAbandonedMay 03, 12Nov 07, 13[G01N]
2012/0303,308 Baseline Setting MethodAbandonedAug 02, 12Nov 29, 12[G06F]
2011/0292,387 Circular Dichroism Spectrophotometric Method And Circular Dichroism Spectrophotometry Apparatus Using ATR MethodAbandonedMay 24, 11Dec 01, 11[G01J]
2010/0305,893 Baseline Setting MethodAbandonedDec 16, 09Dec 02, 10[G06F]
2009/0242,770 Automatic And Continuous Quantitative Analysis Method And Apparatus For Multiple ComponentsAbandonedMar 20, 09Oct 01, 09[G01J]
7361157 Syringe-pump driving apparatusExpiredSep 02, 05Apr 22, 08[A61M]
2008/0022,831 Thin-Film SlicerAbandonedAug 02, 07Jan 31, 08[B26D]
2007/0279,573 Microcell And Microcell HolderAbandonedJun 06, 07Dec 06, 07[G02F]
2006/0164,638 Near-field film-thickness measurement apparatusAbandonedDec 27, 05Jul 27, 06[H01J, G01J]
2006/0119,856 MicroscopeAbandonedDec 05, 05Jun 08, 06[G01B]
2006/0108,285 Nozzle for collecting extracted materialAbandonedNov 07, 05May 25, 06[B01D]
7019849 Depth measuring apparatusExpiredMar 15, 04Mar 28, 06[G01B]
6813402 Fiber, probe and optical head of multiple optical path array type and methods for manufacturing the sameExpiredFeb 19, 02Nov 02, 04[G02B]
6777656 Near-field spectrometer having background spectral informationExpiredSep 11, 02Aug 17, 04[G02B]
2003/0039,429 Scattering type near-field probe, and method of manufacturing the sameAbandonedJul 11, 02Feb 27, 03[G01N, G02B]
2001/0053,023 Wire grid type polarizer and method of manufacturing the sameAbandonedApr 30, 01Dec 20, 01[G02B]
2001/0017,696 RangefinderAbandonedMay 15, 00Aug 30, 01[G01B]
5689114 Gas analyzing apparatusExpiredApr 16, 96Nov 18, 97[G01N]
5424216 No radical measuring method and apparatusExpiredAug 16, 93Jun 13, 95[G01N]
5371596 Optical apparatus components having spectrally overlapping characteristics for measuring semiconductor layer thicknessExpiredMar 08, 93Dec 06, 94[G01B]

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