JENTEK SENSORS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 45161
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 30129
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS990
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 5442
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 456
 
  
 
G01L MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 254
 
  
 
B25B TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING, OR HOLDING143
 
  
 
G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR166
 
  
 
G05D SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES 183
 
  
 
G06E OPTICAL COMPUTING DEVICES 117

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2016/0349,214 INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USEMay 31, 16Dec 01, 16[G01N, G01R]
2015/0160,144 INTERNAL MATERIAL CONDITION MONITORING FOR CONTROLFeb 19, 15Jun 11, 15[G01N]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9823179 Method and apparatus for inspection of corrosion and other defects through insulationJan 21, 16Nov 21, 17[G01N, G06F, G01R]
9772309 Method and apparatus for non-destructive evaluation of materialsDec 10, 14Sep 26, 17[G01N, G01R]
9279784 Durability enhanced and redundant embedded sensorsAug 11, 14Mar 08, 16[G01N, G01R, G01D]
9255875 Method and apparatus for inspection of corrosion and other defects through insulationOct 25, 12Feb 09, 16[G01N, G06F, G01R]
9207131 Method and apparatus for load and additional property measurementMar 29, 13Dec 08, 15[B25B, G01L]
8981018 Internal material condition monitoring for controlMar 14, 05Mar 17, 15[G01N, G05D, G01R, G01B]
8960012 Method and apparatus for detection and characterization of mechanical damageOct 30, 13Feb 24, 15[G01M, G01L, G01B, G01R]
8928316 Method and apparatus for non-destructive evaluation of materialsNov 16, 11Jan 06, 15[G01N, G01R]
8803515 Durability enhanced and redundant embedded sensorsFeb 09, 11Aug 12, 14[G01N, G01R]
8768657 Remaining life prediction for individual components from sparse dataJan 12, 07Jul 01, 14[G06N, G01N, G06F, G06E, G06G, G01B, G21C]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2012/0013,334 Material Property Estimation Using Inverse InterpolationAbandonedSep 28, 11Jan 19, 12[G01R]
2011/0054,806 Component Adaptive Life ManagementAbandonedJun 07, 10Mar 03, 11[G01B]
7533575 Quasistatic magnetic and electric field stress/strain gagesExpiredFeb 05, 07May 19, 09[G01L, G01N, G01B]
7526964 Applied and residual stress measurements using magnetic field sensorsExpiredJan 24, 03May 05, 09[G01N]
7411390 High resolution inductive sensor arrays for UXOExpiredJun 03, 03Aug 12, 08[G01N]
2007/0069,720 Material characterization with model based sensorsAbandonedSep 19, 05Mar 29, 07[G01N]
2007/0029,997 Test circuit with drive windings and sense elementsAbandonedMay 01, 06Feb 08, 07[G01N]
2006/0244,443 Material condition assessment with eddy current sensorsAbandonedJan 30, 06Nov 02, 06[G01N]
2006/0076,952 Segmented field sensorsAbandonedFeb 11, 05Apr 13, 06[G01N]
2005/0083,050 Fluid supports for sensorsAbandonedSep 07, 04Apr 21, 05[G01M]
2005/0017,713 Weld characterization using eddy current sensors and arraysAbandonedJun 09, 04Jan 27, 05[G01N]
2005/0007,106 Hybrid wound/etched winding constructs for scanning and monitoringAbandonedMay 24, 04Jan 13, 05[G01N]
2004/0225,474 Damage tolerance using adaptive model-based methodsAbandonedJan 22, 04Nov 11, 04[G06F]
6781387 Inspection method using penetrant and dielectrometerExpiredAug 20, 02Aug 24, 04[G01R]
2004/0056,654 Magnetic field characterization of stresses and properties in materialsAbandonedMay 20, 03Mar 25, 04[G01N, G01R]
2004/0004,475 High throughput absolute flaw imagingAbandonedApr 18, 03Jan 08, 04[G01N, G01R]
2003/0164,700 High resolution hidden damage imagingAbandonedJan 15, 03Sep 04, 03[G01N, G01R]
2002/0075,006 Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation gridsAbandonedJan 07, 02Jun 20, 02[G01R]
6144206 Magnetometer with waveform shapingExpiredJan 06, 98Nov 07, 00[G01R, G01V]

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