John H. Blanz Company, Inc.

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5166606 High efficiency cryogenic test stationExpiredJun 08, 90Nov 24, 92[G01R]
5160883 Test station having vibrationally stabilized X, Y and Z movable integrated circuit receiving supportExpiredJun 08, 90Nov 03, 92[B25B, F16C, G01R]
5098204 Load balanced planar bearing assembly especially for a cryogenic probe stationExpiredJun 08, 90Mar 24, 92[F16C]
5097207 Temperature stable cryogenic probe stationExpiredNov 03, 89Mar 17, 92[F28F, G01R, H05K]
5077523 Cryogenic probe station having movable chuck accomodating variable thickness probe cardsExpiredJun 08, 90Dec 31, 91[G01R]
4725221 Improved machine for continuously producing an element of a separable fastenerExpiredMay 23, 86Feb 16, 88[B29C]

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