JOHNSTECH INTERNATIONAL CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 31128
 
  
 
H01R ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS 19114
 
  
 
1303 EQUIPMENT FOR DISTRIBUTION OR CONTROL OF ELECTRIC POWER566
 
  
 
H01H ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES 292
 
  
 
B23K SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM 192
 
  
 
B65D CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES 197
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 1155
 
  
 
1004 OTHER MEASURING INSTRUMENTS, APPARATUS AND DEVICES135

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9817026 Wafer level integrated circuit contactor and method of constructionFeb 15, 16Nov 14, 17[G01R]
9804194 Low resistance low wear test pin for test contactorFeb 28, 16Oct 31, 17[G01R, H05K]
9696347 Testing apparatus and method for microcircuit and wafer level IC testingJul 10, 14Jul 04, 17[G01R]
9678106 Electrically conductive pins for microcircuit testerMar 28, 16Jun 13, 17[G01R]
9638714 On-center electrically conductive pins for integrated testingJul 10, 14May 02, 17[G01R]
9606143 Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testingJul 11, 14Mar 28, 17[G01R]
9500673 Electrically conductive kelvin contacts for microcircuit testerOct 15, 13Nov 22, 16[G01R]
9476936 Thermal management for microcircuit testing systemMar 14, 14Oct 25, 16[G01R]
9429591 On-center electrically conductive pins for integrated testingMar 28, 14Aug 30, 16[G01R]
9341649 On-center electrically conductive pins for integrated testingMar 14, 14May 17, 16[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0002,285 Electrically Conductive Pins For Microcircuit TesterAbandonedJan 04, 12Jan 03, 13[G01R]
2012/0062,261 Electrically Conductive Pins For Microcircuit TesterAbandonedSep 07, 11Mar 15, 12[G01R]
2010/0136,840 APPARATUS FOR PROVIDING CONTROLLED IMPEDANCE IN AN ELECTRICAL CONTACTAbandonedFeb 03, 10Jun 03, 10[H01R]
2008/0297,142 CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKETAbandonedJun 26, 08Dec 04, 08[G01R]
2008/0268,666 APPARATUS FOR PROVIDING CONTROLLED IMPEDANCE IN AN ELECTRICAL CONTACTAbandonedJun 13, 08Oct 30, 08[H01R]
2007/0202,714 TEST CONTACT SYSTEM FOR TESTING INTEGRATED CIRCUITS WITH PACKAGES HAVING AN ARRAY OF SIGNAL AND POWER CONTACTSAbandonedJan 17, 07Aug 30, 07[H05K]
2005/0202,725 Apparatus for providing controlled impedance in an electrical contactAbandonedFeb 28, 05Sep 15, 05[H01R]
6814585 Electrical connector with resilient contactExpiredApr 18, 03Nov 09, 04[H01R]
2003/0224,663 Apparatus for providing controlled impedance in an electrical contactAbandonedMar 04, 03Dec 04, 03[H01R]
2003/0068,908 Electrical contact for improved wiping actionAbandonedAug 29, 02Apr 10, 03[H05K]
2003/0030,458 Integrated circuit socket with floating alignment memberAbandonedAug 07, 01Feb 13, 03[G01R]
6182829 I.C. carrier insertExpiredApr 10, 98Feb 06, 01[B65D]

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