JPK Instruments AG

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]810
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 7199
 
  
 
B82Y SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES350
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 159
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
H01J ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS 1127
 
  
 
H01S DEVICES USING STIMULATED EMISSION191

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9080937 Apparatus and a method for investigating a sample by means of several investigation methodsJul 09, 13Jul 14, 15[G01N, G01Q, G06K]
9063335 Apparatus and method for examining a specimen by means of probe microscopyAug 20, 07Jun 23, 15[B82Y, G01Q, G02B]
9018018 Method and apparatus for determining the cell activation of a target cell by an activatorJun 17, 09Apr 28, 15[B82Y, G01N, G01Q]
8898809 Method and apparatus for the combined analysis of a sample with objects to be analyzedJul 24, 08Nov 25, 14[B82Y, G01N, G01Q]
8769711 Method for examining a measurement object, and apparatusJun 30, 06Jul 01, 14[G01Q]
8506909 Device for receiving a test sampleAug 04, 05Aug 13, 13[G01N]
8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscopeJul 24, 08Aug 06, 13[G01Q]
8415613 Method and apparatus for characterizing a sample with two or more optical trapsMay 30, 08Apr 09, 13[H05H, H01S]
8381311 Method for examining a test sample using a scanning probe microscope, measurement system and a measuring probe systemMay 16, 08Feb 19, 13[G01Q]
8368017 Method for the operation of a measurement system with a scanning probe microscope and a measurement systemDec 21, 06Feb 05, 13[G01N]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2011/0302,676 Method and Device for Examining a Sample with a Probe MicroscopeAbandonedMay 30, 08Dec 08, 11[G01Q]
7442922 Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technologyExpiredJul 24, 03Oct 28, 08[G21K]
7155962 Method and apparatus to study a surfactantExpiredMay 17, 02Jan 02, 07[G01N]

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