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KING YUAN ELECTRONICS CO., LTD.
Patent Owner
Stats
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32
total patents issued
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57 Total Apps Published
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Sep 25, 2012 most recent publication
Details
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32 Issued Patents
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20 Issued in last 3 years
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18 Published in last 3 years
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22 Total Citation Count
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Sep 08, 2004 Earliest Filing
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0 Expired/Abandoned/Withdrawn Patents
Technologies
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 21107
B65B MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING 252
B65G TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS 249
G06F ELECTRIC DIGITAL DATA PROCESSING 2298
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2139
B25J MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES 127
G06E OPTICAL COMPUTING DEVICES 114
Top Patents (by citation)
7,454,885 Tray to tube manual exchangerAug 30, 06Nov 25, 08[B65B]3 7,847,571 Semiconductor test system with self-inspection of electrical channel for Pogo towerJul 13, 09Dec 07, 10[G01R]2 7,629,803 Probe card assembly and test probes thereinAug 28, 08Dec 08, 09[G01R]2 7,710,134 Probe card assemblyAug 28, 08May 04, 10[G01R]1 7,701,233 Heat-resistant lens kitJun 25, 07Apr 20, 10[G01R]1 7,639,028 Probe card assembly with ZIF connectorsAug 13, 07Dec 29, 09[G01R]1 7,369,957 Method and system for generating test pulses to test electronic elementsFeb 20, 07May 06, 08[G06F]1
Recent Publications
2012/0212,249 HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOFAug 10, 11Aug 23, 12[G01R, H01B, B22F] 2012/0212,250 Semiconductor element testing system having air filterJul 13, 11Aug 23, 12[G01R] 2012/0206,157 Structure of burn-in ovenSep 14, 11Aug 16, 12[G01R] 2012/0158,758 Comparison device and method for comparing test pattern files of a wafer testerFeb 18, 11Jun 21, 12[G06F] 2012/0103,967 Burn-in oven having inverter fan and heat regulatorJun 01, 11May 03, 12[A21B] 2012/0041,710 METHOD AND APPARATUS FOR DETERMINING DISPOSITION OF VIA HOLE ON PRINTED CIRCUIT BOARDSep 15, 11Feb 16, 12[G06F] 2011/0018,568 Semiconductor test equipment with concentric pogo towersNov 10, 09Jan 27, 11[G01R] 2011/0018,570 SELF-CLEANING PACKAGE TESTING SOCKETNov 20, 09Jan 27, 11[G01R, B08B] 2010/0237,879 METHOD AND APPARATUS FOR IMPROVING YIELD RATIO OF TESTINGOct 30, 09Sep 23, 10[G01R]
Recent Patents
8,275,568 Semiconductor test system with self-inspection of electrical channelJun 23, 09Sep 25, 12[G01R] 8,248,090 ZIF connectors and semiconductor testing device and system using the sameMar 28, 09Aug 21, 12[G01R] 8,193,819 Method and apparatus for improving yield ratio of testingOct 30, 09Jun 05, 12[G01R] 8,085,059 RF chip test methodJan 20, 09Dec 27, 11[G01R] 8,066,113 Segregating apparatusMar 24, 09Nov 29, 11[B65G] 8,030,944 Method for continuity test of integrated circuitJun 20, 08Oct 04, 11[G01R] 8,008,938 Testing system moduleJun 05, 09Aug 30, 11[G01R] 8,009,896 Coplanarity inspection device for printed circuit boardsMar 04, 08Aug 30, 11[G06K] 8,010,468 Method for wafer analysis with artificial neural network and system thereofOct 15, 07Aug 30, 11[G06E, G06F] 7,973,548 Semiconductor test equipment with concentric pogo towersNov 10, 09Jul 05, 11[G01R]
Top Inventors for This Owner
