KING YUAN ELECTRONICS CO., LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 16143
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 3444
 
  
 
G01L MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE 155
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1205
 
  
 
G06E OPTICAL COMPUTING DEVICES 117
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
G08B SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS 193
 
  
 
G11C STATIC STORES 1150

Top Patents (by citation)

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Recent Publications

Publication # Title Filing Date Pub Date Intl Class
2015/0074,094 COMPARISON DEVICE AND METHOD FOR COMPARING TEST PATTERN FILES OF A WAFER TESTERNov 17, 14Mar 12, 15[G06F]

Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9921269 Comparison device and method for comparing test pattern files of a wafer testerNov 17, 14Mar 20, 18[G06F, G01R]
9116064 Structure of built-in self-test for pressure tester and method thereofDec 27, 12Aug 25, 15[G01L]
8751178 Method and apparatus for determining disposition of via hole on printed circuit boardSep 15, 11Jun 10, 14[G01N]
8275568 Semiconductor test system with self-inspection of electrical channelJun 23, 09Sep 25, 12[G01R]
8248090 ZIF connectors and semiconductor testing device and system using the sameMar 28, 09Aug 21, 12[G01R]
8193819 Method and apparatus for improving yield ratio of testingOct 30, 09Jun 05, 12[G01R]
8085059 RF chip test methodJan 20, 09Dec 27, 11[G01R]
8030944 Method for continuity test of integrated circuitJun 20, 08Oct 04, 11[G01R]
8008938 Testing system moduleJun 05, 09Aug 30, 11[G01R]
8009896 Coplanarity inspection device for printed circuit boardsMar 04, 08Aug 30, 11[G06K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2012/0212,249 HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOFAbandonedAug 10, 11Aug 23, 12[H01B, B22F, G01R]
2012/0212,250 Semiconductor element testing system having air filterAbandonedJul 13, 11Aug 23, 12[G01R]
2012/0206,157 Structure of burn-in ovenAbandonedSep 14, 11Aug 16, 12[G01R]
2012/0158,758 Comparison device and method for comparing test pattern files of a wafer testerAbandonedFeb 18, 11Jun 21, 12[G06F]
2012/0136,614 Wafer inspection systemAbandonedMar 09, 11May 31, 12[G06F]
2012/0103,967 Burn-in oven having inverter fan and heat regulatorAbandonedJun 01, 11May 03, 12[A21B]
8066113 Segregating apparatusExpiredMar 24, 09Nov 29, 11[B65G]
7938611 Feeding apparatus of test equipmentExpiredNov 17, 05May 10, 11[B65B]
7924039 Self-cleaning package testing socketExpiredNov 20, 09Apr 12, 11[G01R]
7804315 Probe cardExpiredMay 05, 09Sep 28, 10[G01R]
2010/0191,203 System and equipment for persons with stomaAbandonedJul 10, 09Jul 29, 10[A61F]
7737711 Test apparatus having pogo probes for chip scale packageExpiredJul 09, 08Jun 15, 10[G01R]
2010/0126,755 ELECTRIC CONDUCTOR WITH GOOD CURRENT CAPABILITY AND A METHOD FOR IMPROVING THE CURRENT CAPABILITY OF AN ELECTRIC CONDUCTORAbandonedFeb 11, 09May 27, 10[H01B]
2010/0119,345 Position-returning mechanism for a pick-and-place apparatusAbandonedJul 17, 09May 13, 10[H01L]
2010/0109,673 HEAT-RESISTANT LENS KITAbandonedJan 05, 10May 06, 10[G02B, G01R]
7701233 Heat-resistant lens kitExpiredJun 25, 07Apr 20, 10[G01R]
2010/0052,721 TEST SOCKET AND TEST MODULEAbandonedOct 17, 08Mar 04, 10[G01R]
2010/0030,513 Method for Disposing Power/Ground Plane of PCBAbandonedDec 08, 08Feb 04, 10[G06F, G01B]
7639028 Probe card assembly with ZIF connectorsExpiredAug 13, 07Dec 29, 09[G01R]
7617924 Tray transportation deviceExpiredSep 07, 07Nov 17, 09[B65G]

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