KOBE PRECISION INC.

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6406923 Process for reclaiming wafer substratesExpiredJul 31, 00Jun 18, 02[H01L]
6384415 Method of evaluating quality of silicon wafer and method of reclaiming the waterExpiredJun 20, 00May 07, 02[G01J]
5855735 Process for recovering substratesExpiredOct 03, 95Jan 05, 99[C23F]
5622875 Method for reclaiming substrate from semiconductor wafersExpiredAug 17, 94Apr 22, 97[H01L]

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