KOMATSU ELECTRONIC METALS CO., LTD.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
C30B SINGLE-CRYSTAL GROWTH 3819
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 20342
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 5201
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 264
 
  
 
C01B NON-METALLIC ELEMENTS; COMPOUNDS THEREOF277
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
B01D SEPARATION 1133
 
  
 
B32B LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM1156
 
  
 
B44C PRODUCING DECORATIVE EFFECTS 133
 
  
 
B65D CONTAINERS FOR STORAGE OR TRANSPORT OF ARTICLES OR MATERIALS, e.g. BAGS, BARRELS, BOTTLES, BOXES, CANS, CARTONS, CRATES, DRUMS, JARS, TANKS, HOPPERS, FORWARDING CONTAINERS; ACCESSORIES, CLOSURES, OR FITTINGS THEREFOR; PACKAGING ELEMENTS; PACKAGES 197

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8090544 Method for determining concentration of impurity elementJun 02, 05Jan 03, 12[G01N]
7576852 Semiconductor wafer inspection device and methodSep 14, 06Aug 18, 09[G01N]
7522290 Apparatus and method for inspecting semiconductor waferJun 01, 05Apr 21, 09[G01B]
7141992 Method for measuring impurity metal concentrationApr 26, 05Nov 28, 06[G01R]
6877668 Marking method for semiconductor waferOct 25, 00Apr 12, 05[G06K]
6858076 Method and apparatus for manufacturing single-crystal ingotMay 10, 00Feb 22, 05[C30B]
6777820 Semiconductor waferJan 27, 00Aug 17, 04[H01L]
6517667 Apparatus for polishing a semiconductor waferJun 17, 98Feb 11, 03[C23F]
6458203 System for manufacturing a single-crystal ingot employing czochralski technique, and method of controlling the systemApr 27, 00Oct 01, 02[C30B]
6325851 Crystal manufacturing apparatus and methodSep 13, 99Dec 04, 01[C30B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
6495465 Method for appraising the condition of a semiconductor polishing clothExpiredMar 10, 99Dec 17, 02[H01L]
6315827 Apparatus for producing single crystalExpiredSep 30, 99Nov 13, 01[C30B]
6245678 Method for manufacturing semiconductor wafersExpiredJan 07, 99Jun 12, 01[H01L]
6217650 Epitaxial-wafer fabricating processExpiredJun 15, 99Apr 17, 01[C30B]
6171393 Seed crystal and method of manufacturing single crystalExpiredFeb 17, 99Jan 09, 01[C30B]
6106617 Apparatus for feeding raw material into a quartz crucibleExpiredFeb 02, 98Aug 22, 00[C30B]
6068699 Apparatus for fabricating semiconductor single crystalExpiredAug 26, 96May 30, 00[C30B]
6066565 Method of manufacturing a semiconductor waferExpiredNov 19, 98May 23, 00[H01L]
6042646 Simple method for detecting temperature distributions in single crystals and method for manufacturing silicon single crystals by employing the simple methodExpiredJan 29, 98Mar 28, 00[C30B]
6018884 Air blow apparatus for a semiconductor waferExpiredJun 30, 97Feb 01, 00[F26B]
6019837 Detecting method of impurity concentration in crystal, method for producing single crystal and apparatus for the pull-up of a single crystalExpiredNov 25, 97Feb 01, 00[C30B]
6019842 Method and apparatus for loading raw material into a quartz crucibleExpiredSep 09, 98Feb 01, 00[C30B]
6006737 Device and method for cutting semiconductor-crystal barsExpiredJan 29, 98Dec 28, 99[B28D]
6007621 Apparatus for feeding raw material into a quartz crucible and method of feeding the sameExpiredSep 22, 98Dec 28, 99[G30B]
6004860 SOI substrate and a method for fabricating the sameExpiredAug 30, 96Dec 21, 99[H01L]
6001007 Template used for polishing a semiconductor waferExpiredMay 30, 97Dec 14, 99[B24B]
5997641 Seed-crystal holder for single-crystal pulling devices with magnetic field applied theretoExpiredDec 08, 97Dec 07, 99[C30B]
5995217 Apparatus and a method for measuring a density of defects existing in a semiconductor wafer and an apparatus and a method for measuring an inherent scattering intensity of defects existing in a semiconductor waferExpiredSep 03, 98Nov 30, 99[G01N]
5971191 Gasket for use in a containerExpiredFeb 14, 97Oct 26, 99[B65D]
5968260 Method for fabricating a single-crystal semiconductorExpiredMar 31, 97Oct 19, 99[C30B]

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