LTX CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 18141
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 8439
 
  
 
G04F TIME-INTERVAL MEASURING 217
 
  
 
H02M APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF 2100
 
  
 
H03D DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER 247
 
  
 
H05K PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS 2154
 
  
 
A61M DEVICES FOR INTRODUCING MEDIA INTO, OR ONTO, THE BODY 1153
 
  
 
F16M FRAMES, CASINGS, OR BEDS, OF ENGINES OR OTHER MACHINES OR APPARATUS, NOT SPECIFIC TO AN ENGINE, MACHINE, OR APPARATUS PROVIDED FOR ELSEWHERE; STANDS OR SUPPORTS134
 
  
 
G01D MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 159
 
  
 
G04B MECHANICALLY-DRIVEN CLOCKS OR WATCHES; MECHANICAL PARTS OF CLOCKS OR WATCHES IN GENERAL; TIME-PIECES USING THE POSITION OF THE SUN, MOON, OR STARS 136

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8269480 Method and apparatus for identifying and reducing spurious frequency componentsJul 09, 08Sep 18, 12[G01R]
8239434 System, method, and apparatus for distortion analysisJul 09, 08Aug 07, 12[G06F]
7969177 System and method for thermal limit controlDec 22, 08Jun 28, 11[G01R]
7957924 System and method for distortion analysisMay 09, 08Jun 07, 11[G06F, G01R]
7919968 System and method for distortion analysisJul 09, 07Apr 05, 11[G01R]
7849374 Testing a transceiverOct 11, 06Dec 07, 10[G01R]
7231561 Apparatus and method for data pattern alignmentJul 17, 02Jun 12, 07[G01R]
7092837 Single platform electronic testerSep 15, 03Aug 15, 06[G06F]
7035887 Apparatus and method for data shiftingJul 17, 02Apr 25, 06[G06F]
6942019 Apparatus and method for circuit board liquid coolingMar 25, 02Sep 13, 05[H05K]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
7664621 System and method for mapping system transfer functionsExpiredMay 09, 08Feb 16, 10[G06F, G01R]
7512857 Pattern correction circuitExpiredJul 29, 05Mar 31, 09[G06F]
7196566 High-resolution variable attenuation deviceExpiredOct 31, 03Mar 27, 07[H03L]
7191368 Single platform electronic testerExpiredAug 22, 01Mar 13, 07[G06F]
2006/0245,122 Electrical load switchAbandonedApr 28, 05Nov 02, 06[H02H]
6903562 Integrated micromachine relay for automated test equipment applicationsExpiredSep 16, 03Jun 07, 05[G01R]
6768960 System for and method of performing device-oriented testsExpiredMay 23, 01Jul 27, 04[G06F]
6703825 Separating device response signals from composite signalsExpiredJan 31, 03Mar 09, 04[G01R]
6700396 Integrated micromachine relay for automated test equipment applicationsExpiredMay 16, 01Mar 02, 04[G01R]
6560756 Method and apparatus for distributed test pattern decompressionExpiredJul 02, 01May 06, 03[G06F]
6512989 Generating and controlling analog and digital signals on a mixed signal test systemExpiredMar 26, 99Jan 28, 03[G06F]
6489797 Test system including a test head with integral device for generating and measuring output having variable current or voltage characteristicsExpiredJul 15, 99Dec 03, 02[G01R]
6323694 Differential comparator with a programmable voltage offset for use in an automatic testerExpiredApr 01, 98Nov 27, 01[H03K]

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