LUMASENSE TECHNOLOGIES HOLDINGS, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 14192
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1167
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS990
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 838
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 3202
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 3359
 
  
 
B24D TOOLS FOR GRINDING, BUFFING, OR SHARPENING 228
 
  
 
B24B MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 165
 
  
 
F21V FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR 1109
 
  
 
F23L AIR SUPPLY; DRAUGHT-INDUCING; SUPPLYING NON-COMBUSTIBLE LIQUID OR GAS 116

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9857543 Bidirectional optoelectronic sub-assemblyMar 24, 17Jan 02, 18[G02B]
9696259 Optode sensor with integrated referenceAug 18, 15Jul 04, 17[H01J, G01N]
9651254 Measuring and controlling flame quality in real-timeOct 24, 14May 16, 17[F23L, F23N]
9255846 Digital temperature determination using a radiometrically calibrated and a non-calibrated digital thermal imagerJul 17, 14Feb 09, 16[G01J, G01D]
9176107 System and method for monitoring asset health by dissolved gas measurementFeb 01, 13Nov 03, 15[G01N]
D711257 SensorMar 15, 13Aug 19, 14[1004]
7374335 In situ optical surface temperature measuring techniques and devicesFeb 24, 06May 20, 08[G01K]
7348562 Method for adapting an existing thermal imaging deviceFeb 02, 04Mar 25, 08[G01J]
7080940 In situ optical surface temperature measuring techniques and devicesMay 05, 04Jul 25, 06[G01J]
7042581 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafersDec 15, 04May 09, 06[G01B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2008/0033,300 Systems and methods for monitoring temperature during electrosurgery or laser therapyAbandonedAug 04, 06Feb 07, 08[A61B]
6426232 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environmentExpiredJun 15, 98Jul 30, 02[H01L]
6413147 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environmentExpiredFeb 14, 00Jul 02, 02[B24B]
6110752 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environmentExpiredAug 27, 97Aug 29, 00[B24B]
5499733 Optical techniques of measuring endpoint during the processing of material layers in an optically hostile environmentExpiredSep 16, 93Mar 19, 96[G01N]
4752141 Fiberoptic sensing of temperature and/or other physical parametersExpiredOct 22, 86Jun 21, 88[G01K, G01L, G01D]

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