M2N INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
C23F NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACES 135
 
  
 
C25F PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR 117

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9671431 Probe card and manufacturing methodApr 28, 11Jun 06, 17[G01R]
8287745 Method for fabricating probe tipMay 29, 08Oct 16, 12[G01Q, C23F]
7767101 Method for fabricating probe for use in scanning probe microscopeMay 24, 07Aug 03, 10[C25F]
7733103 Probe cardSep 20, 07Jun 08, 10[G01R]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2010/0134,126 PROBE AND METHOD FOR MANUFACTURING THE SAMEAbandonedMar 31, 05Jun 03, 10[H01L, G01R]
2006/0073,627 Probe for a scanning probe microscope and method for fabricating sameAbandonedMar 31, 04Apr 06, 06[H01L, C23F]
6995499 Micro piezoelectric actuator and method for fabricating sameExpiredApr 17, 02Feb 07, 06[H01L]

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