Marena Systems Corporation
Patent Owner
Stats
- 0 US PATENTS IN FORCE
- 0 US APPLICATIONS PENDING
- Jun 23, 2009 most recent publication
Details
- 0 Issued Patents
- 0 Issued in last 3 years
- 0 Published in last 3 years
- 72 Total Citation Count
- Jan 22, 2003 Earliest Filing
- 4 Expired/Abandoned/Withdrawn Patents
Patent Activity in the Last 10 Years
Technologies
- No Technology to Display
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Recent Publications
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Recent Patents
- No Recent Patents to Display
Expired/Abandoned/Withdrawn Patents
Patent #
Title
Status
Filing Date
Issue/Pub Date
Intl Class
7551769 Data structures and algorithms for precise defect location by analyzing artifactsExpiredSep 21, 06Jun 23, 09[H04N, G01N, G06K]
7149343 Methods for analyzing defect artifacts to precisely locate corresponding defectsExpiredFeb 18, 03Dec 12, 06[G06K]
6840666 Methods and systems employing infrared thermography for defect detection and analysisExpiredJan 22, 03Jan 11, 05[G01N, G01R]
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