MARTEK, INC.

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 12147
 
 
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 5193
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS297
 
 
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 2360
 
 
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 139
 
 
 
F16C SHAFTS; FLEXIBLE SHAFTS; ELEMENTS OF CRANKSHAFT MECHANISMS; ROTARY BODIES OTHER THAN GEARING ELEMENTS; BEARINGS 169
 
 
 
G05B CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS 1100
 
 
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 1134
 
 
 
H02K DYNAMO-ELECTRIC MACHINES 1106
 
 
 
H02P CONTROL OR REGULATION OF ELECTRIC MOTORS, GENERATORS, OR DYNAMO-ELECTRIC CONVERTERS; CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS 186

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8120304 Method for improving motion times of a stageDec 12, 08Feb 21, 12[G05B, H02P]
7852097 Methods and apparatuses for improved positioning in a probing systemMar 04, 08Dec 14, 10[G01R]
7622939 Methods and apparatuses for improved stabilization in a probing systemOct 18, 07Nov 24, 09[G01R]
7368929 Methods and apparatuses for improved positioning in a probing systemJan 18, 06May 06, 08[G01R]
7362116 Method for probing impact sensitive and thin layered substrateNov 09, 05Apr 22, 08[G01R]
7352198 Methods and apparatuses for improved stabilization in a probing systemJan 18, 06Apr 01, 08[G01R]
7345466 Method and apparatus for cleaning a probe cardAug 02, 05Mar 18, 08[G01R]
7259548 Testing circuits on substrateJan 07, 05Aug 21, 07[G01R]
7098649 Testing circuits on substratesJun 17, 04Aug 29, 06[G01R]
7002337 Testing circuits on substratesJul 27, 04Feb 21, 06[G01R]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
8519728 Compliance control methods and apparatusesExpiredDec 12, 08Aug 27, 13[G01R]
8310195 Method for improving motion times of a stageExpiredFeb 15, 12Nov 13, 12[B64C]
8311758 Methods and apparatuses for dynamic probe adjustmentExpiredJan 18, 06Nov 13, 12[G01C]
7453260 Testing circuits on substrateExpiredJul 24, 06Nov 18, 08[G01R]
2008/0150,559 METHOD FOR PROBING IMPACT SENSITVE AND THIN LAYERED SUBSTRATEAbandonedMar 04, 08Jun 26, 08[G01R]
7180284 Testing circuits on substratesExpiredOct 04, 05Feb 20, 07[G01R]
6861859 Testing circuits on substratesExpiredOct 22, 01Mar 01, 05[G01R]
6781394 Testing circuits on substrateExpiredOct 22, 01Aug 24, 04[G01R]
6771060 Testing circuits on substratesExpiredOct 22, 01Aug 03, 04[G01R]
6547409 Method and apparatus for illuminating projecting features on the surface of a semiconductor waferExpiredJan 12, 01Apr 15, 03[F21V, G06K]
2002/0158,643 Method and apparatus for generating values for selected pixels used in evaluating semiconductor wafer bumpsAbandonedJan 11, 02Oct 31, 02[G01R]
6417683 Apparatus for electrical testing of a substrate having a plurality of terminalsExpiredJun 27, 00Jul 09, 02[G01R]
6320372 Apparatus and method for testing a substrate having a plurality of terminalsExpiredJul 09, 99Nov 20, 01[G01R]
6310985 Measuring angular rotation of an objectExpiredJul 29, 98Oct 30, 01[G06K]
5019771 Contact sensing for integrated circuit testingExpiredMay 21, 90May 28, 91[G01R]
5010295 Ball screw supported Z stageExpiredJun 14, 89Apr 23, 91[G01R]
4935676 Method of moving head to correct for hysteresisExpiredMay 15, 89Jun 19, 90[H02K]
4607525 Height measuring systemExpiredOct 09, 84Aug 26, 86[G01B, G01R]
4455512 System for linear motor controlExpiredApr 23, 82Jun 19, 84[G05B]
4335338 Linear motorExpiredJun 30, 80Jun 15, 82[B64C]

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