Megatest Corporation

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
G06F ELECTRIC DIGITAL DATA PROCESSING 1446

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
5917331 Integrated circuit test method and structureOct 23, 95Jun 29, 99[G01R]
5773990 Integrated circuit test power supplySep 29, 95Jun 30, 98[G01R]
5606568 Method and apparatus for performing serial and parallel scan testing on an integrated circuitNov 30, 95Feb 25, 97[G06F]

Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
5521493 Semiconductor test system including a novel driver/load circuitExpiredNov 21, 94May 28, 96[G01R]
4809221 Timing signal generatorExpiredApr 26, 88Feb 28, 89[G06F]
4806852 Automatic test system with enhanced performance of timing generatorsExpiredJan 28, 87Feb 21, 89[G01R]
4779221 Timing signal generatorExpiredJan 28, 87Oct 18, 88[G06F]
4527126 AC parametric circuit having adjustable delay lock loopExpiredAug 26, 83Jul 02, 85[H03K]
4517512 Integrated circuit test apparatus test headExpiredMay 24, 82May 14, 85[G01R]

Top Inventors for This Owner

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