MELIKECHI, NOUREDDINE

Patent Owner

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
 
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS198
 
 
 
G01H MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES 120

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
6731380 Method and apparatus for simultaneous measurement of the refractive index and thickness of thin filmsJun 18, 01May 04, 04[G01H, G01B]

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